In this feature article, we discuss
the fundamental use of materials-characterization
methods that directly determine structural
information on the dye···TiO2 interface
in dye-sensitized solar cells (DSCs). This interface is usually buried
within the DSC and submerged in solvent and electrolyte, which renders
such metrological work nontrivial. We will show how ex-situ X-ray reflectometry (XRR), atomic-force microscopy
(AFM), grazing-incidence X-ray scattering (GIXS), pair-distribution-function
analysis of X-ray diffraction data (gaPDF), and in-situ neutron reflectometry (NR) can be used to
deliver specific structural information on the dye···TiO2 interface regarding dye anchoring, dye aggregation, molecular
dye orientation, intermolecular spacing between dye molecules, interactions
between the dye molecules and the TiO2 surface, and interactions
between the dye molecules and the electrolyte components and precursors.
Some of these materials-characterization techniques have been developed
specifically for this purpose. We will demonstrate how the direct
acquisition of such information from materials-characterization experiments
is crucial for assembling a holistic structural picture of this interface,
which in turn can be used to develop DSC design guidelines. Moreover,
we will show how these methodologies can be used in the experimental-validation
process of “design-to-device” pipelines for big-data-
and machine-learning-based materials discovery. We conclude with an
outlook on further developments of this design-to-device approach
as well as the materials characterization of more dye···TiO2 interfacial structures that involve known DSC dyes using
the methods described herein. In addition, we propose to combine these
formally disparate metrologies so that their complementary merits
can be exploited simultaneously. New metrologies of this kind could
serve as a “one-stop-shop” for the materials characterization
of surfaces, interfaces, and bulk structures in DSCs and other devices
with layered architectures.