Electromagnetic Analysis for Miniaturized Patch Antennas With Self-Biased Ferrite Thin Films

Higher order VIE method based on non‐conformal discretisation for EM scattering from anisotropic objects

“…The first one is enforcing the divergence conforming or the continuity condition of the unknown functions is not required here [23,24], which is different from the situation introduced in [25]. Note that our method is also different from Tong' method [23,24], where the nabla operator is not moved onto neither the basis function nor the testing function. The other one lies in the property of the VEFIE formulated in (2), i.e.…”

Deep neural network for retrieving material's permittivity from S‐parameters

“…1,2 It is crucial to use a dielectric material with the right relative permittivity (ε ′ r ) and loss tangent (tan δ) to tune the impedance and estimate the frequency-dependent loss of a component. 3 In this context, an accurate technique for characterization ε ′ r and tan δ over a broad bandwidth is called for. There have been several existing dielectric property characterization techniques, such as the transmission/ reflection (T/R) method, 4 resonant method, 5 free-space method, 6,7 and so forth.…”

“…Dielectric materials are widely used to implement microwave and millimeter wave components, such as capacitors, antennas, and radomes 1,2 . It is crucial to use a dielectric material with the right relative permittivity ($${\varepsilon }_{{\rm{r}}}^{^{\prime} }$$) and loss tangent (tan $$\delta $$) to tune the impedance and estimate the frequency‐dependent loss of a component 3 . In this context, an accurate technique for characterization $${\varepsilon }_{{\rm{r}}}^{^{\prime} }$$ and tan $$\delta $$ over a broad bandwidth is called for.…”