2009 International Semiconductor Conference 2009
DOI: 10.1109/smicnd.2009.5336529
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Electromagnetic analysis of the experimental setup used to investigate the ratchet effect in two-dimensional electron system under microwave radiation

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“…Due to the complexity of this closed setup, a methodology is proposed that helps in having a complete picture of the closed system used and hence improving its electromagnetic response. Several electromagnetic models have been created and simulated using full-wave electromagnetic simulation finite element method to represent the setup that could be used at room temperature [18][19][20] and the actual setup used at low temperature [16,21]. Three descriptors have been computed that can quantify the Ratchet Effect inside the cryogenic system; the distribution of the electric field inside the cavity, the uniformity of the incident electric field linear polarization and the uniformity of the incident electric field density on the sample surface.…”
Section: Introductionmentioning
confidence: 99%
“…Due to the complexity of this closed setup, a methodology is proposed that helps in having a complete picture of the closed system used and hence improving its electromagnetic response. Several electromagnetic models have been created and simulated using full-wave electromagnetic simulation finite element method to represent the setup that could be used at room temperature [18][19][20] and the actual setup used at low temperature [16,21]. Three descriptors have been computed that can quantify the Ratchet Effect inside the cryogenic system; the distribution of the electric field inside the cavity, the uniformity of the incident electric field linear polarization and the uniformity of the incident electric field density on the sample surface.…”
Section: Introductionmentioning
confidence: 99%