We present a micro-Raman study of InP/InGaP tandem junction
photovoltaic
nanowires. These nanowires render possible InGaP compositions that
cannot be made in thin films due to strain. The micro-Raman spectra
acquired along the nanowires reveal the existence of compositional
changes in the InGaP alloy associated with the doping sequence. The
heavily Zn-doped In
x
Ga1–x
P (x is the In molar fraction) side
of the tunnel diode is Ga rich, x = 0.25, with respect
to the n-type and intrinsic segments of the top cell, which are close
to the nominal composition of the NWs (x = 0.35).
The p-type end segment is still Ga-rich. Electromagnetic resonances
are observed in the tunnel diode. The Raman signal arising from the
InGaP side of the tunnel diode is significantly enhanced. This enhancement
permits the observation of a Raman mode that can be associated with
an LO phonon plasmon coupled mode (LOPCM). This mode has not been
previously reported in the literature of InGaP, and it permits the
Raman characterization of the tunnel diode. The analysis of this mode
and its relation to the LO phonon modes of the alloy, InP-like and
GaP-like, allows to establish an apparent one-mode behavior for the
phonon plasmon coupling. It indicates that hole plasma couples to
the GaP-like LO mode. The LOPCMs are modeled using the Lindhard Mermin
formalism for the dielectric function.