1993
DOI: 10.1109/74.210828
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Electromagnetics at Arizona State University

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Cited by 4 publications
(4 citation statements)
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“…Figure 1 shows the static and optical permittivity profile across a Si-SiO 2 interface as a function of position along the direction normal to the interface. The dielectric constants in the interior of SiO 2 and Si regions are in excellent agreement with experimental values of the corresponding bulk systems (static and optical values of about 12 for Si [39], and 4.5 and 2.5 for SiO 2 [40,41], respectively). However, in the transition region between Si and SiO 2 and close to the outer surface planes, we find an enhancement of the dielectric constant, compared to that of the bulk values.…”
Section: Si-sio 2 and Si-hfo 2 Interfacessupporting
confidence: 72%
“…Figure 1 shows the static and optical permittivity profile across a Si-SiO 2 interface as a function of position along the direction normal to the interface. The dielectric constants in the interior of SiO 2 and Si regions are in excellent agreement with experimental values of the corresponding bulk systems (static and optical values of about 12 for Si [39], and 4.5 and 2.5 for SiO 2 [40,41], respectively). However, in the transition region between Si and SiO 2 and close to the outer surface planes, we find an enhancement of the dielectric constant, compared to that of the bulk values.…”
Section: Si-sio 2 and Si-hfo 2 Interfacessupporting
confidence: 72%
“…From the figure, we can see that the dielectric constant in the inner layers away from the surface approach the bulk Si value of about 12 for both optical and static cases, in good agreement with experimental estimates. 39 At the region within 3 Å of the surfaces, the polarization and dielectric constant increase from the bulk values in the static case due to the emergence of ionic character of bonds close to the surface. Termination of the free slab surfaces with H atoms results in a small reduction in the polarization and dielectric constant enhancement at the slab surfaces.…”
Section: A Si and C 12 H 26 (Polymer) Slabsmentioning
confidence: 99%
“…The antenna resonance frequency is about 6.39 GHz, which is in the C-frequency band and is powered by a 50 ohm coaxial SMA probe. Also, all the dimensions of this antenna were calculated and designed according to the standard formulas presented in [9]. Figure 1 shows the structure of the designed antenna.…”
Section: Description Of the Designed Antennamentioning
confidence: 99%
“…If the antennas are placed next to each other in an array [5] (both in receiver and transmitter modes), an undesired coupling occurs between the two antenna radiators elements, due to the reciprocal coupling of electric fields [6] which is induced from the first radiating element to the second radiating element and causes current to flow on the second radiating element, which is called the undesired electromagnetic coupling effect of the reciprocating coupling [7]. This mutual coupling becomes important when the ratio of the thickness of the sublayer to the wavelength of the free space is l where h is the thickness of the substrate, l 0 is the wavelength of the free space and e r is the relative permittivity or dielectric constant of the substrate.This effect depends on the type of antenna and its design parameters, the relative position of the elements in the array (the distance between the two antennas is inversely related to the amount of coupling between the two antennas), and the power supply of the array elements [9]. In a typical array, to properly isolate the radiators and the antenna, the distance between the radiators is at least l .…”
Section: Introductionmentioning
confidence: 99%