1990
DOI: 10.1080/00207219008920318
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Electromigration—a tutorial introduction†

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Cited by 15 publications
(5 citation statements)
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“…Since corrosion of a pipe buried in soil naturally occurs slowly, the reaction was accelerated in the laboratory experiments by inducing an electrical potential across the test samples, using the principles of electro-osmosis and electromigration (electrokinetics) (Clarke et al, 1990;Schmidt, 2007). This method was selected over alternative options so as to avoid introducing any additional ions apart from the ones generated as by-products of the cast iron corrosion (essentially iron ions) so the changes on clay soil properties could be investigated.…”
Section: Arrangement Of the Laboratory Experimentsmentioning
confidence: 99%
“…Since corrosion of a pipe buried in soil naturally occurs slowly, the reaction was accelerated in the laboratory experiments by inducing an electrical potential across the test samples, using the principles of electro-osmosis and electromigration (electrokinetics) (Clarke et al, 1990;Schmidt, 2007). This method was selected over alternative options so as to avoid introducing any additional ions apart from the ones generated as by-products of the cast iron corrosion (essentially iron ions) so the changes on clay soil properties could be investigated.…”
Section: Arrangement Of the Laboratory Experimentsmentioning
confidence: 99%
“…In this routing, transmission occurs between the bundles, which gears end-to-end routing optimization. The transmission of the GBR is calculated as in (2)  bj bi N E min = GBR (2) GBR objective function calculates the optimal shortest Communication between the bundles having minimum transmission rate and minimum energy utilization. The algorithmic strides of the proposed topology construction are given subsequently:…”
Section: B Global Bundle Routing (Gbr) Functionmentioning
confidence: 99%
“…With the cut down in the technology, the confinement imperfection in Field Programmable Gate Array (FPGA) due to the increase in the thickness as a result of deterioration of equipment over time [1]. The physical defects such as enduring flaws or tough flaws emerge as irreversible flaws in the equipment [2][3][4]. In order to overcome the existing difficulties and to tackle the upcoming flaws, the researchers focused on equipment with long-durability in applications where alignment is absurd.…”
Section: Introductionmentioning
confidence: 99%
“…• The gradual electron movement in the conducting wire causes a momentum transfer between electrons and ions of the interconnecting material. This momentum transfer results in Electromigration that leads to voids (open circuit) or hillocks (closed circuit) in the interconnects [18].…”
Section: Faults and Degradationmentioning
confidence: 99%