1982
DOI: 10.1109/t-ed.1982.20698
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Electron and hole mobilities in silicon as a function of concentration and temperature

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Cited by 875 publications
(344 citation statements)
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“…27 We found that the electron and hole mobilities of the type-I clathrate K 8 Al 8 Si 38 , as shown in Fig. 5, are smaller than those of diamond Si [36][37][38] by a factor of 6-10 at room temperature. The lower values of the mobilities are partly due to the small amount of disorder present in the cages.…”
Section: A Clathratesmentioning
confidence: 77%
“…27 We found that the electron and hole mobilities of the type-I clathrate K 8 Al 8 Si 38 , as shown in Fig. 5, are smaller than those of diamond Si [36][37][38] by a factor of 6-10 at room temperature. The lower values of the mobilities are partly due to the small amount of disorder present in the cages.…”
Section: A Clathratesmentioning
confidence: 77%
“…To achieve lowtemperature operation, we assume degenerate doping, and therefore a low mobility is to be expected. We have used a value of 100cm 2 /(V · s) [134] for both electron and hole mobilities. Because this value will be limited by ionized impurity scattering, it is likely to change little as the temperature is decreased to 1 K.…”
Section: Appendix C: Integration Time and Refractory Periodmentioning
confidence: 99%
“…We used the Arora mobility model 20 . Both mobilities decrease with temperature leading to an increase in resistivity and increased heat dissipation.…”
Section: Figmentioning
confidence: 99%