2002
DOI: 10.1007/s11661-002-0132-3
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Electron backscatter diffraction analysis of microstructural evolution in hot-deformed 6xxx series aluminum alloys

William H. van Geertruyden,
Steven R. Claves,
Wojciech Z. Misiolek

Abstract: The electron backscatter diffraction (EBSD) technique is used to analyze the crystallographic grain orientation of deformed microstructures for 6xxx series aluminum alloy extrusions. In a partially extruded billet of aluminum, deformation zones with different crystallographic characteristics can be seen. Using compression testing performed on a Gleeble thermal-mechanical simulator under various conditions, the formation of different deformation zones is simulated. The EBSD technique is used to characterize sam… Show more

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Cited by 6 publications
(3 citation statements)
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“…The reported flow pattern in the present study leads to a discontinuous structure in the vicinity of the weld seam. As observed by van Geertruyden et al , 52 the discontinuous grain structure is associated with different crystallographic texture components. In the present study, it is therefore argued that this discontinuous structure has marked implications on the material performance, as the areas with sharp texture transitions at the weld zone can exhibit anisotropic deformation properties, leading to a non-uniform deformation behaviour.…”
Section: Discussionsupporting
confidence: 51%
“…The reported flow pattern in the present study leads to a discontinuous structure in the vicinity of the weld seam. As observed by van Geertruyden et al , 52 the discontinuous grain structure is associated with different crystallographic texture components. In the present study, it is therefore argued that this discontinuous structure has marked implications on the material performance, as the areas with sharp texture transitions at the weld zone can exhibit anisotropic deformation properties, leading to a non-uniform deformation behaviour.…”
Section: Discussionsupporting
confidence: 51%
“…Table 4 shows the results of mechanical properties tests for the standard profile (AA6063) and the new profile (AA6005A) compared to data from the standard [36]. The results of mechanical properties tests for the 6063 and 6005A alloy profiles are presented in Table 4.…”
Section: Product Validationmentioning
confidence: 99%
“…Election backscatter diffraction, or backscatter Kikuchi diffraction, is a scanning electron microscope (SEM) based technique that can be used to determine local microstructural texture, generally associated with the crystallographic orientation of individual grains within a material. This allows for microstructure reconstruction and detailed characterization of the microstructural properties of a material [3]. EBSD utilizes automated Kikuchi pattern indexing software to determine the orientation of multiple grains at once, making it a fast and accurate method for generating large quantities of data.…”
Section: Introductionmentioning
confidence: 99%