2013
DOI: 10.1002/pssc.201200598
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Electron‐beam incident‐angle‐ resolved cathodoluminescence studies on bulk ZnO crystals

Abstract: Electron‐beam incidence‐angle‐resolved cathodoluminescence (IAR‐CL) measurements on ZnO single crystals were demonstrated as an alternative way for the depth‐resolved cathodoluminescence (CL) study by scanning acceleration voltage of the electron‐beam. Incidence‐angle dependent near‐band‐edge CL intensities were well reproduced by analyses considering a radiation pattern, an expansion of the electron‐beam irradiation area, and an internal absorption factors. The quantitative agreement between the experimental … Show more

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Cited by 6 publications
(1 citation statement)
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“…Details of the CL setup can be found elsewhere. 17 As shown in Fig. 2, the optical transmittance spectra at room temperature exhibited distinct shoulders at 4.6-4.7 eV for the (001) undoped and (100) Si-doped substrates.…”
mentioning
confidence: 80%
“…Details of the CL setup can be found elsewhere. 17 As shown in Fig. 2, the optical transmittance spectra at room temperature exhibited distinct shoulders at 4.6-4.7 eV for the (001) undoped and (100) Si-doped substrates.…”
mentioning
confidence: 80%