2012
DOI: 10.4028/www.scientific.net/msf.725.261
|View full text |Cite
|
Sign up to set email alerts
|

Electron-Beam-Induced Current Study of Electronic Property Change at SrTiO<sub>3</sub> Bicrystal Interface Induced by Forming Process

Abstract: We investigated the spatial variation of energy band structure in a SrTiO3 (001) bicrystal with the (100) 10° tilt boundary before and after the annealing process at 973 K under a vacuum of ~10-7 Torr and after the subsequent forming process with electrical dielectric breakdown, using electron beam induced current (EBIC) method in the temperature range between 200 and 300K. Although the EBIC contrast at the tilt boundary was weak before and after the annealing, it became visible after the forming process and s… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 5 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?