“…Furthermore, the application of magnetic fields during imaging is often severely limited due to their deflecting and depolarizing effects on the electrons, although there are sometimes strategies to partially overcome this [16]. Here, we focus on methods which use an unpolarized electron beam as the probe; however, we note that certain specialized approaches such as spin-polarized low-energy electron microscopy employ polarized electron beams to excite the sample, details of which can be found in [9,17,18].…”