1989
DOI: 10.1080/01418618908229779
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Electron diffraction study of the faceting of tilt grain boundaries in NiO

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Cited by 7 publications
(2 citation statements)
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“…Strong faceting of tilt GBs was observed in the YBa 2 Cu 3 O 7-x thin films deposited on SrTiO 3 bicrystal substrates [212]. The microfacets and the array of lattice and GB dislocations were observed also in GBs with low h = 8°and high h = 41°misorientation angles in NiO [213].…”
Section: Faceting-roughening In Oxidesmentioning
confidence: 79%
“…Strong faceting of tilt GBs was observed in the YBa 2 Cu 3 O 7-x thin films deposited on SrTiO 3 bicrystal substrates [212]. The microfacets and the array of lattice and GB dislocations were observed also in GBs with low h = 8°and high h = 41°misorientation angles in NiO [213].…”
Section: Faceting-roughening In Oxidesmentioning
confidence: 79%
“…However, because of its formalism, the Bollmann's method remains limited to systems for which the two phases (metal and oxide) present crystal lattices rather close in term of symmetry and cell parameters. For instance, this method was successfully applied to the Ni/NiO system for which the metal and oxide lattices remain close [2][3]; but for other systems like Zr/ZrO 2 , the "O" lattice formalism is too restrictive [4]. It is then necessary to generalize this formalism; various solutions exist [5][6][7][8].…”
Section: Introductionmentioning
confidence: 99%