Electron diffraction study on chemical short-range order in covalent amorphous solids

Ishimaru, Manabu; Hirata, Akihiko; Naito, Muneyuki

doi:10.1016/j.nimb.2011.12.054

Cited by 3 publications

(2 citation statements)

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“…The acceleration voltage for Ar ion milling first adopted 4 keV and decreased to 1 keV at final stage (GATAN, PIPS) in order to minimize ion milling damage. The details about collecting electron diffraction pattern for atomic pair-distribution analysis have been described in previous works 23 , 37 .…”

Section: Methodsmentioning

confidence: 99%

“…Structural information such as the distribution of interatomic distances, bond angles, and coordination number is embedded in the PDF peak positions, widths, and relative intensities. PDF has been widely used to examine the short-to-medium range order in different metallic glasses and covalent amorphous solid 21 – 23 . Therefore, in the present work, we use electron elastic scattering to obtain the radial distribution function of amorphous SiOC film, aiming to probe the amorphous structure information before and after irradiation/implantation.…”

Section: Introductionmentioning

confidence: 99%

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Helium Irradiation and Implantation Effects on the Structure of Amorphous Silicon Oxycarbide

Inoue

Ishimaru

et al. 2017

Sci Rep

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Despite recent interest in amorphous ceramics for a variety of nuclear applications, many details of their structure before and after irradiation/implantation remain unknown. Here we investigated the short-range order of amorphous silicon oxycarbide (SiOC) alloys by using the atomic pair-distribution function (PDF) obtained from electron diffraction. The PDF results show that the structure of SiOC alloys are nearly unchanged after both irradiation up to 30 dpa and He implantation up to 113 at%. TEM characterization shows no sign of crystallization, He bubble or void formation, or segregation in all irradiated samples. Irradiation results in a decreased number of Si-O bonds and an increased number of Si-C and C-O bonds. This study sheds light on the design of radiation-tolerant materials that do not experience helium swelling for advanced nuclear reactor applications.

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Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%