1983
DOI: 10.1002/anie.198304561
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Electron Diffraction with the Transmission Electron Microscope as a Phase‐Determining Diffractometer—From Spatial Frequency Filtering to the Three‐Dimensional Structure Analysis of Ribosomes

Abstract: Dedicated to Professor Adolf Butenandt on the occasion of his 80th birthdayChemists recognize X-ray crystaI structure analysis and electron microscopy as powerful methods of analysis. In the last 20 years the basic ideas of X-ray diffraction analysis have been extended to the field of electron microscopy, whereby an image-forming apparatus is converted into an electron diffractometer, and through which an old dream of crystallographers can be realized-the measurement of the phase shift of scattered waves, a pr… Show more

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Cited by 20 publications
(5 citation statements)
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“…In contrast, the EM produces actual images, which is tantamount to saying it measures both amplitudes and phases in Fourier space, giving rise to an adage coined by Walter Hoppe’s (see Hoppe, 1983), of the EM as a ‘phase-measuring diffractometer.’…”
Section: Single Molecules Versus Crystalsmentioning
confidence: 99%
See 1 more Smart Citation
“…In contrast, the EM produces actual images, which is tantamount to saying it measures both amplitudes and phases in Fourier space, giving rise to an adage coined by Walter Hoppe’s (see Hoppe, 1983), of the EM as a ‘phase-measuring diffractometer.’…”
Section: Single Molecules Versus Crystalsmentioning
confidence: 99%
“…In X-ray crystallography, information on amplitudes is concentrated in small spots or layer lines in the Fourier transform, and phases are not supplied directly by the diffractometer but have to be garnered by computation with the aid of additional experiments, employing multiple heavy atom replacements or multiple wavelengths. In contrast, the EM produces actual images, which is tantamount to saying it measures both amplitudes and phases in Fourier space, giving rise to an adage coined by Walter Hoppe's (see Hoppe, 1983), of the EM as a ‘phase-measuring diffractometer.’…”
Section: Single Molecules Versus Crystalsmentioning
confidence: 99%
“…The review does not include any consideration of near-field microscopy using scanning probes of any kind, nor methods which only look at surfaces. Previous publications which have considered the relative merits of neutron, X-ray or electron microscopy include Breedlove & Trammel (1970), Hoppe (1983) and Sayre et al (1977). Useful text books include Cowley (1975), Reimer (1989) and Spence (1988).…”
Section: Introductionmentioning
confidence: 99%
“…2.3 and 2.4 of Natesh [3]) does not exist in EM. The electron microscope, in Hoppe's words, is a "phase-measuring diffractometer" [40]. Hence, extreme care has to be taken in image processing.…”
Section: Image Processing and Three-dimensional Reconstructionmentioning
confidence: 99%