2002
DOI: 10.1016/s0368-2048(02)00166-4
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Electron–electron coincidence spectroscopies at surfaces

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Cited by 20 publications
(12 citation statements)
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“…The coincident photoelectron lines were narrowed compared to those of the total (noncoincidence) photoelectron spectrum and the energy position of their maximum showed, within the lifetime-broadened photoelectron linewidth, linear dispersion with the energy of the detected Auger electron [10]. This behaviour shows that the Auger process is not independent of photoemission and was interpreted as evidence of the inadequacy of the two-step description of photoexcitation and decay [10,12,17].…”
Section: Introductionmentioning
confidence: 93%
See 1 more Smart Citation
“…The coincident photoelectron lines were narrowed compared to those of the total (noncoincidence) photoelectron spectrum and the energy position of their maximum showed, within the lifetime-broadened photoelectron linewidth, linear dispersion with the energy of the detected Auger electron [10]. This behaviour shows that the Auger process is not independent of photoemission and was interpreted as evidence of the inadequacy of the two-step description of photoexcitation and decay [10,12,17].…”
Section: Introductionmentioning
confidence: 93%
“…The Coulomb operator responsible for the Auger transition acts on the complete system involving both final electrons. The complete process can thus be considered a resonance in the double-photoionization continuum [17], which is particularly suitable in the present context where we also consider direct DPE processes. A complete description of both processes must account for the initial-state electron correlation and interaction of the final-state correlated wavefunction of the emitted electron pair with the crystal lattice.…”
Section: Introductionmentioning
confidence: 99%
“…21 This technique is sometimes called photoelectron Auger coincidence spectroscopy (PEACS). 22 Very recently, we measured Si L 23 VV Auger electron Si 2p photoelectron coincidence spectra (Si 2p-Si L 23 VV PEACS) of Si(100)-2×1, and identified the topmostsurface Si 2p components by taking advantage of the extremely short escape depth of 1.2Å. 23 In this paper, we report on the surface-site-selective Si L 23 VV AES and Si 2p PES of clean Si(111)-7×7 measured with Si L 23 VV-Si 2p APECS and Si 2p-Si L 23 VV PEACS.…”
Section: Introductionmentioning
confidence: 99%
“…ble to "conventional" spectroscopies. One exciting direction is the implementation of "coincidence" experiments, such as Auger-photoelectron coincidence spectroscopy (APECS) (Haak et al, 1978;Stefani et al, 2002), which should be revisited with the advent of improved photoemission detection technology. As mentioned above, the principal issue with such experiments is their relatively poor resolution, mainly limiting the method to getting information on the correlation hole around an electron (Schumann et al, 2007).…”
Section: Prospects For Future Developmentsmentioning
confidence: 99%