Electron emission projection imager

Baturin, S. S.; Baryshev, Sergey V.

doi:10.1063/1.4977472

Cited by 15 publications

(17 citation statements)

References 13 publications

(12 reference statements)

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…The experiments were performed using a field electron microscopy technique given in Ref. [13]. The measurement setup is shown in Fig.2.…”

Section: Samples and Experimentalmentioning

confidence: 99%

“…Metal needs to be deposited on YAG:Ce screen to make it conductive, then electric field can be establish between anode and cathode to accelerate electrons through ultra-high vacuum, and capture and them into the ground. The coating is thin enough to let electrons penetrate through Mo to YAG:Ge to produce green light and thick enough to prevent YAG:Ce screen from charging up [13]. Mo is chosen because it has high melting point (2896 K), so it can sustain in high power density electron beam.…”

Section: Samples and Experimentalmentioning

confidence: 99%

See 1 more Smart Citation

Field emission microscopy of carbon nanotube fibers: Evaluating and interpreting spatial emission

Posos

Fairchild

Park

et al. 2020

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

Self Cite

View full text Add to dashboard Cite

In this work, we quantify field emission properties of cathodes made from carbon nanotube (CNT) fibers. The cathodes were arranged in different configurations to determine the effect of cathode geometry on the emission properties. Various geometries were investigated including: 1) flat cut fiber tip, 2) folded fiber, 3) looped fiber and 4) and fibers wound around a cylinder. We employ a custom field emission microscope to quantify I-V characteristics in combination with laterallyresolved field-dependent electron emission area. Additionally we look at the very early emission stages, first when a CNT fiber is turned on for the first time which is then followed by multiple ramp-up/down. Upon the first turn on, all fibers demonstrated limited and discrete emission area. During ramping runs, all CNT fibers underwent multiple (minor and/or major) breakdowns which improved emission properties in that turn-on field decreased, field enhancement factor and emission area both increased. It is proposed that breakdowns are responsible for removing initially undesirable emission sites caused by stray fibers higher than average. This initial breakdown process gives way to a larger emission area that is created when the CNT fiber sub components unfold and align with the electric field. Our results form the basis for careful evaluation of CNT fiber cathodes for dc or low frequency pulsed power systems in which large uniform area emission is required, or for narrow beam high frequency applications in which high brightness is a must.

show abstract

“…The experiments were performed using a field electron microscopy technique given in Ref. [13]. The measurement setup is shown in Fig.2.…”

Section: Samples and Experimentalmentioning

confidence: 99%

Section: Samples and Experimentalmentioning

confidence: 99%

Field emission microscopy of carbon nanotube fibers: Evaluating and interpreting spatial emission

Posos

Fairchild

Park

et al. 2020

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

Self Cite

View full text Add to dashboard Cite

show abstract

“…В качестве примера редких методик можно назвать регистрацию светового и инфракрасного излучения полевых эмиттеров [17,18], регистрацию распределения центров эмиссии с помощью резистивного анодного покрытия [19], а также регистрацию пороговых напряжений включения по мере выгорания отдельных эмиссионных центров на картине свечения [20].…”

Section: Introductionunclassified

Регистрация Зависимости Числа Эмиссионных Центров От Времени Как Инструмент Анализа Токовых Флуктуаций Полевых Катодов

Колосько¹,

Филиппов²,

Попов³

2021

Физика Твердого Тела

View full text Add to dashboard Cite

A new tool for obtaining the frequency characteristics of the interaction of emission sites with adsorbates was developed. The technique is based on the use of a computerized field projector with online processing of patterns of the distribution of emission sites over the cathode surface. The resulting dependences reflect the frequency of fluctuations in the activity of individual sites. The influence of the choice of the threshold brightness parameter, the proximity of the sites to each other and the stability of the total emission current on the shape of these curves is considered. The coincidence of the shapes of curves constructed by various methods (in online mode, in post-processing mode and in the mode of random processes modeling) is analyzed.

show abstract

“…Field emission properties of (N)UNCD were characterized and visualized using a field emission microscopy approach described in our previous work, see Refs. [19,21]. In such experiments, field emission from planar (N)UNCD surface is laterally resolved by making use of complementary pair of imaging anode screens.…”

mentioning

confidence: 99%

Field electron emission induced glow discharge in a nanodiamond vacuum diode

Baturin¹,

Nikhar²,

Baryshev³

2019

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

The present letter extends the prior findings on self-induced heating of solid state field emission devices. It was found that a vacuum diode (base pressure ∼ 10 −9 Torr), that makes use of graphiterich polycrystalline diamond as cathode material, can switch from diode regime to resistor regime, to glow discharge plasma regime without any external perturbation, i.e. all transitions are self-induced. Combined results of in situ field emission microscopy and ex situ electron microscopy and Raman spectroscopy suggested that the nanodiamond cathode of the diode heated to about 3000 K which caused self-induced material evaporation, ionization and eventually micro-plasma formation. Our results confirm that field emission, commonly called cold emission, is a very complex phenomenon that can cause severe thermal load. Thermal load and material runaway could be the major factors causing vacuum diode deterioration, i.e. progressive increase in turn-on field, decrease in field enhancement factor, and eventual failure. arXiv:1811.04186v1 [cond-mat.mtrl-sci]

show abstract

Electron emission projection imager

Cited by 15 publications

References 13 publications

Field emission microscopy of carbon nanotube fibers: Evaluating and interpreting spatial emission

Field emission microscopy of carbon nanotube fibers: Evaluating and interpreting spatial emission

Регистрация Зависимости Числа Эмиссионных Центров От Времени Как Инструмент Анализа Токовых Флуктуаций Полевых Катодов

Field electron emission induced glow discharge in a nanodiamond vacuum diode

Contact Info

Product

Resources

About