1997
DOI: 10.1118/1.597930
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Electron fluence correction factors for conversion of dose in plastic to dose in water

Abstract: In radiation dosimetry protocols, plastic is allowed as a phantom material for the determination of absorbed dose to water in electron beams. The electron fluence correction factor is needed in conversion of dose measured in plastic to dose in water. There are large discrepancies among recommended values as well as measured values of electron fluence correction factors when polystyrene is used as a phantom material. Using the Monte Carlo technique, we have calculated electron fluence correction factors for inc… Show more

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Cited by 26 publications
(35 citation statements)
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“…Therefore, conversion to the TG‐51 protocol should result in the same magnitude of change for the parallel plate system as would be expected from previously published values 20 25 for the Farmer‐type chamber system (NEL 2571 and PTW N23333 chambers), i.e., approximately 0.51.2% depending on the energy. However, the TG‐51 protocol explicitly prohibits the use of parallel plate chambers and plastic media for the calibration of photon beams.…”
Section: Resultssupporting
confidence: 74%
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“…Therefore, conversion to the TG‐51 protocol should result in the same magnitude of change for the parallel plate system as would be expected from previously published values 20 25 for the Farmer‐type chamber system (NEL 2571 and PTW N23333 chambers), i.e., approximately 0.51.2% depending on the energy. However, the TG‐51 protocol explicitly prohibits the use of parallel plate chambers and plastic media for the calibration of photon beams.…”
Section: Resultssupporting
confidence: 74%
“…In addition to the uncertainty in the Prepl and Pwall values, another source of uncertainty that may assist in explaining the electron dose differences is the electron beam water to polystyrene fluence correction, ϕpolyw. Ding et al 25 reported that there are large variations in the fluence correction factors published in the literature for polystyrene. There even exist differences in the fluence correction factors between the TG‐21 and TG‐25 protocols 26 .…”
Section: Resultsmentioning
confidence: 99%
“…Corrections are required for differences in stopping power and scattering power. Ding et al 5,6 introduced a depthscaling or range-scaling factor, c pl , and an electron fluence correction factor, pl w , and a chamber-dependent fluence correction factor, h pl , respectively, for the correction factors. c pl converts depth in plastic to the equivalent depth in water so that the electron spectra are identical in shape at two positions in two materials.…”
Section: Introductionmentioning
confidence: 99%
“…Similarly, h pl corrects the electrometer reading in the plastic phantom to that in the water phantom and accounts for the difference in the reading in the two phantoms at the same water-equivalent depth. h pl depends on the wall correction factor, P wall , of the ionization chamber used, 6,7 which accounts for the nonphantom equivalence of the chamber wall material. h pl is equal to pl w when P wall in water and plastic is the same.…”
Section: Introductionmentioning
confidence: 99%
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