Electron-impact single ionization of Si<sup>+</sup>

Jonauskas, V.

doi:10.1051/0004-6361/202038266

Cited by 2 publications

(1 citation statement)

References 41 publications

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“…The influence of correlation effects on the energy levels and SI cross sections requires a separate study that involves large-scale calculations. It should be noted that correlation effects often have a diminishing effect on the calculated SI cross sections (Jonauskas et al 2019;Jonauskas 2020b). The theoretical SI threshold for the Fe 2+ ion is 27.818 eV, which is ∼9% lower than the NIST-recommended value of 30.651 eV.…”

Section: Resultsmentioning

confidence: 99%

Electron-impact single ionization for the Fe²⁺ ion

Kynienė,

Kisielius,

Jonauskas

2023

A&A

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Electron-impact ionization was analyzed for all 34 levels of the ground configuration of the Fe2+ ion. Both direct and indirect ionization processes are included in the study. For the direct process, the potential of the ionized ion was used to explain experimental data. For the indirect process, electron-impact excitation with subsequent autoionization was considered. The convergence of the cross sections of the indirect process was determined by considering the excitations up to shells with the principal quantum number n ⩽ 20. The main contribution to the indirect process was determined by the 3p → 3d excitations. The scaled distorted-wave approximation was applied to explain measurements for the Fe2+ ion. Scaling of the cross sections lowers values by ~35% at the peak for the ground level and ~50% for the highest level of the ground configuration of the Fe2+ ion. The experimental value for the single ionization threshold was used to provide better agreement with the measurements for the cross sections. This led to the cross sections for the levels of the ground configuration diminishing in size by 15–25%. The direct process contributes ~70% and ~50% to the total ionization from the lowest and highest levels of the ion, respectively.

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Section: Resultsmentioning

confidence: 99%

Electron-impact single ionization for the Fe²⁺ ion

Kynienė,

Kisielius,

Jonauskas

2023

A&A

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Electron-impact ionization of Si IV–VIII in hot plasmas

Pain,

Benredjem

2024

J. Phys. B: At. Mol. Opt. Phys.

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In this work, we investigate the ionization of silicon by electron impacts in hot plasmas. Our calculations of the cross sections and rates rely on the Coulomb-Born-Exchange, Binary-Encounter-Dipole and Distorted-Wave methods implemented in the Flexible Atomic Code (FAC), and are compared with measurements and other theoretical values. We use a semi-empirical formula for the cross section, which involves a small set of adjustable parameters. The rate coefficient is then expressed in terms of these parameters and is represented in a large temperature interval, up to 108 K. As expected, the agreement with measurements improves for increasing ion charges, confirming the applicability of our approach to hot plasma studies such as inertialconfinement fusion, and its reliability. Configuration interaction is taken into account and is shown to affect the cross section at low energy, in particular for Si3+.

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Electron-impact single ionization of Si⁺

Cited by 2 publications

References 41 publications

Electron-impact single ionization for the Fe²⁺ ion

Electron-impact single ionization for the Fe²⁺ ion

Electron-impact ionization of Si IV–VIII in hot plasmas

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Electron-impact single ionization of Si+

Cited by 2 publications

References 41 publications

Electron-impact single ionization for the Fe2+ ion

Electron-impact single ionization for the Fe2+ ion

Electron-impact ionization of Si IV–VIII in hot plasmas

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Electron-impact single ionization of Si⁺

Electron-impact single ionization for the Fe²⁺ ion

Electron-impact single ionization for the Fe²⁺ ion