Electron inelastic mean free paths in solids: A theoretical approach

Pandya, Siddharth H.; Vaishnav, B. G.; Joshipura, K. N.

doi:10.1088/1674-1056/21/9/093402

Cited by 10 publications

(19 citation statements)

References 39 publications

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“…The Si coverage rate can be estimated by the XPS signal of the silver substrate. The inelastic mean free path (IMFP) of electrons in Si and SiO 2 is 3.2 and 3.7 nm, respectively . For our samples with ≈0.8 ML of Si on Ag(111), we observe a Ag4s/Si2p intensity ratio of 3/4, a much higher value than in ref.…”

Section: Resultscontrasting

confidence: 52%

Oxidation of Epitaxial Silicene on Ag(111)

Solonenko

Selyshchev

Zahn

et al. 2018

Physica Status Solidi (b)

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The high chemical reactivity of epitaxial silicene on Ag(111) still remains a debated subject in the literature. In particular results on the oxidation of epitaxial silicene and its related lifetime under ambient conditions are controversially discussed. Here, a detailed investigation of the oxygen exposure to epitaxial silicene layers investigated by means of X-ray photoemission and in situ Raman spectroscopy is reported. The results should clearly cease the discussion on the stability of epitaxial silicene against oxygen as it becomes completely oxidized after an exposure to only 100 L of oxygen. Such a small dose sets strict limits for ex situ studies of epitaxial silicene. Besides the formation of silicon oxide also the silver substrate surface oxidizes, suggesting that the silicene layer can hardly protect it, probably owing to the high number of domain boundaries within the silicene layer.

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Section: Resultscontrasting

confidence: 52%

Oxidation of Epitaxial Silicene on Ag(111)

Solonenko

Selyshchev

Zahn

et al. 2018

Physica Status Solidi (b)

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“…We also report comparisons of our calculated IMFPs for the 42 inorganic compounds with IMFPs calculated by Reich et al Akkerman et al Pandya et al Kwei and Li, Kwei et al Boutboul et al Ashley and Anderson, Dapor and Miotello, and Dapor, and with IMFPs measured by Iakoubovskii et al Egerton, Meltzman et al Gurban et al Pi et al Krawczyk et al Chung et al Wang and Shapiro, McCartney and Gajdardziska‐Josifovska, Lee et al and Bideux et al Zommer et al and Jung et al We also make comparisons between the measured IMFPs and IMFPs from the relativistic TPP‐2M equation.…”

Section: Introductionmentioning

confidence: 74%

“…Figure shows comparisons of our IMFPs with IMFPs calculated for Al 2 O 3 , GaAs, KBr, KCl, MgO, NaCl, and SiO 2 for energies between 10 eV and 10 keV. We have plotted the IMFP data in the literature, listed above, in Figure without any energy‐scaling corrections.…”

Section: Discussionmentioning

confidence: 99%

“…The solid lines show our IMFPs that were calculated from optical ELFs with the FPA. The symbols indicate IMFPs calculated by Reich et al (for Al 2 O 3 and SiO 2 ), Akkerman et al (for Al 2 O 3 , KBr, KCl, MgO, and SiO 2 ), Pandya et al (for Al 2 O 3 and SiO 2 ), Kwei and Li (for GaAs), Boutboul et al (for NaCl), Kwei et al (for MgO, glassy SiO 2 and crystalline SiO 2 ), Ashley and Anderson (for SiO 2 ), Dapor and Miotello (for Al 2 O 3 , MgO, and SiO 2 ), Dapor and Miotello (for SiO 2 ), and Dapor (for SiO 2 )…”

Section: Discussionmentioning

confidence: 99%

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Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm

Shinotsuka

Tanuma

Powell

et al. 2018

Surface & Interface Analysis

116

145

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Y 3 Al 5 O 12 , ZnS, ZnSe, and ZnTe) for electron energies from 50 eV to 200 keV. These calculations were made with energy-loss functions (ELFs) obtained from measured optical constants for 15 compounds while calculated ELFs were utilized for the other 27 compounds. Checks based on ELF sum rules showed that the calculated ELFs were superior to the measured ELFs that we had used previously. Our calculated IMFPs could be fitted to a modified form of the relativistic Bethe equation for inelastic scattering of electrons in matter for energies from 50 eV to 200 keV. The average rootmean-square (RMS) deviation in these fits was 0.60%. The IMFPs were also compared with a relativistic version of our predictive Tanuma-Powell-Penn (TPP-2M) equation.The average RMS deviation in these comparisons was 10.7% for energies between 50 eV and 200 keV. This average RMS deviation is almost the same as that found in a similar comparison for a group of 41 elemental solids (11.9%) although relatively large deviations were found for cubic BN (65.6%) and hexagonal BN (34.3%). If these two compounds are excluded in the comparisons, the average RMS deviation becomes 8.7%. We found generally satisfactory agreement between our calculated IMFPs and values from other calculations and from experiments.

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“…The IMFPs in this low energy range are considerably important or relevant for Auger‐electron spectroscopy (AES) and x‐ray photoelectron spectroscopy (XPS), to determine the average depth of the surface, and for quantitative surface analysis. In literature, there are also some theoretical models, atomistic models and experimental procedures for calculating IMFP of electrons, but all the processes are very complicated and one need to have prior knowledge about the incident convergence angle, the collection angle, density of the specimen and incident electron energy (Lenz, ; Malis, ; Gries, ; Iakoubovskii et al ., b; Pandya et al ., ). Relativistic factor should also be incorporated in some of these methods.…”

Section: Introductionmentioning

confidence: 97%

Study of inelastic mean free path of metal nanostructures using energy filtered transmission electron microscopy imaging

Ghosh

Bardhan

Bhattacharya

et al. 2015

Journal of Microscopy

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We report a simple method for measuring the inelastic mean free path of nanostructures of known geometry using energy filtered transmission electron microscopy imaging. The mean free path of inelastic electrons was measured by using systems having known symmetry, such as cylindrical or cubic, combined with Poisson statistics without employing the knowledge of microscope parameters, namely the convergence angle and the collection angle. Having inherent symmetry of such systems, their absolute thickness can be measured from their two-dimensional projection images. We have calculated mean free path of inelastic scattering of electrons in gold, silver and nickel doing case study research by employing gold nanorod, silver nanocube and nickel nanorod lying on a carbon-coated TEM grid at two different electron energies (viz. 200 and 300 keV) following this alternative approach. Results obtained using such alternative approach were verified using microscope parameters.

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Electron inelastic mean free paths in solids: A theoretical approach

Cited by 10 publications

References 39 publications

Oxidation of Epitaxial Silicene on Ag(111)

Oxidation of Epitaxial Silicene on Ag(111)

Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm

Study of inelastic mean free path of metal nanostructures using energy filtered transmission electron microscopy imaging

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