Electron interference experiment with optically zero propagation distance for V-shaped double slit

Harada, Ken; Akashi, Takumi; Takahashi, Yoshio; Kodama, Tetsuya; Shimada, Keiko; Ono, Yoshimasa A.; Mori, Shigeo

doi:10.35848/1882-0786/abd91e

Cited by 4 publications

(2 citation statements)

References 31 publications

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“…Recently, we have been working on new experiments [9, 10] using a holography transmission electron microscope [11] equipped with a special optical system and electron biprisms to fully understand the particle/wave duality concept and to clarify the relation between the electron path information and interference. Using a V-shaped double slit under an optically zero-propagation distance condition, i.e., an infocus imaging condition, we observed in one image the interference features of electrons under the pre-interference condition, the interference condition, and the post-interference condition [10].…”

Section: Introductionmentioning

confidence: 99%

Sophisticated Double-Slit Interference Experiments Using Electron Waves

Harada

Takahashi

2023

e-J. Surf. Sci. Nanotechnol.

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Electron double-slit experiments, the essence of quantum mechanical "wave/particle duality", have been extensively and continuously studied because their unrealistic interpretations have attracted many researchers. Here, we discuss recent sophisticated V-shaped double-slit experiments to elucidate electron-path information, i.e., which slit electrons pass through, which path they pursue, and where they arrive and interfere on the image plane. In a transmission electron microscope, an optically zero-propagation distance condition was realized, where the double-slit position was imaged just on the detector plane. Interference fringes composed of dot images were controlled by using two electron biprisms. Using a V-shaped double slit, we confirmed that it is possible to observe interference fringes only when the path information of individual electrons is not available. Furthermore, we studied how the interference fringes would shift their detected positions when electron wave phases were modulated before illumination to the double slit. Phase shifts were generated by tilting electron beams. We confirmed that each single electron as a wave changed its phase even when it traveled alone inside the microscope.

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Section: Introductionmentioning

confidence: 99%

Sophisticated Double-Slit Interference Experiments Using Electron Waves

Harada

Takahashi

2023

e-J. Surf. Sci. Nanotechnol.

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“…Such Feynman-thought experiments seem to obey the principle of complementarity. The idea of an interferometer using asymmetrical slits was also proposed [18] and initially implemented in the Fresnel near-field condition, which was considered to obey as well the complementarity principle [19,20]. Menon and Qureshi (M&Q) [21] derived a more general and appropriate theoretical relationship between Dparticle distinguishability and V-wave visibility based on the complementarity principle to replace the Englert-Grinberger-Yasin (EGY) quadratic correlation of traditional symmetrical double-slit experiments [22,23].…”

Section: Introductionmentioning

confidence: 99%

Wave-particle duality in the asymmetrical double-slit interference experiments

Van,

Duc,

Thanh

et al. 2023

Preprint

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We perform spectral analysis based on a suitable theoretical correlation between V-wave visibility and D-particle distinguishability following the complemen-tarity principle to verify wave-particle duality in the asymmetrical double-slit experiments. The selective interference spectra obtained in the experiments ensure the single-photon approximation in the Fraunhofer far-field condition. The results show that the theoretical interpretation following wave-particle complementarity may not be consistent with the experimental data, especially at the first main minima of the optical diffraction distributions. A dilemma would arise when one tries to revise the theoretical explanations for preserving the complementarity principle.

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Analysis of spatial point patterns in electron-counting images

et al. 2022

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In this study, the spatial counting statistics of free electron beams, which were released via field emission from cold metal and propagated through a vacuum region, were investigated to examine the normal functioning of the counting equipment for electron correlation spectroscopy. The beam electrons were recorded separately according to the locations of individual events as they reached the direct detection transmission CMOS sensor. We examined the spatial point patterns arising from the locations of the individual events of each primary electron being detected in the case of electrons in a state in which the wave function is constant on the sensor. The quadrat method, which compares the observed frequencies of the number of electron-counts in subsets of the study region with the predicted frequencies from a Poisson distribution, indicates a clustering-type departure from complete spatial randomness. To explore some of the basic principles governing the location of coherent electrons being counted, Ripley’s K-function and the corresponding L-function of a stationary spatial point process were used to test the complete spatial randomness from the data. The maximum peak in the average of the L-functions was sensitive only to the mean counts per frame. Thus, clustering of spatial point patterns may result from abnormalities in the direct detection camera. When the interaction of the beam electrons with the sensor is included in the simulation, there is a reasonable match between the average of the L-functions and the experimental curves with the theoretically simulated curves.

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Electron interference experiment with optically zero propagation distance for V-shaped double slit

Cited by 4 publications

References 31 publications

Sophisticated Double-Slit Interference Experiments Using Electron Waves

Sophisticated Double-Slit Interference Experiments Using Electron Waves

Wave-particle duality in the asymmetrical double-slit interference experiments

Analysis of spatial point patterns in electron-counting images

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