Electron-ion recombination in dense rare gases: Energy diffusion theory vs simulation

Abstract

Articles you may be interested inData analysis process of a toroidal analyzer for electron-ion collision experiments Rev.Electron-ion recombination rate constants in dense gaseous argon and krypton: Effects of electric field strength and the addition of N 2 or CH 4Effect of an external electric field on diffusion-controlled bulk electron-ion recombination in high-mobility systems An analytical method using the concept of diffusion in energy space is applied to calculate the electron-ion recombination rate constant and the electron escape probability in dense gaseous argon and krypton. The results are compared with the respective data obtained from computer simulations. The discrepancies between the two methods are found to be relatively small. The applicability of the energy diffusion approach is discussed.

Electron attachment kinetics coupled to electron thermalization in SF6/Ar mixtures

“…Electron transport coefficients in mixtures of SF 6 and the inert gases are of interest [6,7], as well as the kinetics of electron swarms [8]. There are also some important extensions of the studies in the gas phase to dense media [9]. The electron-SF 6 collision cross sections are reasonably well known and analytic expressions for the cross sections have been reported [10][11][12].…”