1970
DOI: 10.1016/0032-3950(70)90450-8
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Electron-microscopical and electron diffraction study of the deformation of thin films of spherulitic polyvinylidenefluoride

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Cited by 15 publications
(2 citation statements)
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“…Figure 2(A) shows the X-ray diffraction pattern of a nonoriented PVDF sample, with the assignment of the different crystal reflections of the ␣ and ␤ phases, [9][10][11][12] and provides a comparison with the X-ray diffraction patterns of the blue processed PVDF suture fiber oriented at X = 90°and 0°[ Fig. 2(B, C), respectively].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Figure 2(A) shows the X-ray diffraction pattern of a nonoriented PVDF sample, with the assignment of the different crystal reflections of the ␣ and ␤ phases, [9][10][11][12] and provides a comparison with the X-ray diffraction patterns of the blue processed PVDF suture fiber oriented at X = 90°and 0°[ Fig. 2(B, C), respectively].…”
Section: Resultsmentioning
confidence: 99%
“…Identification of the crystalline planes was carried out using X-ray data previously published on PVDF. [9][10][11][12] Orientation was measured by azimutal rotation of the sample about the normal to its surface, from X = −90°to 90°at a rotating rate of 0.5°/15 s, with the goniometer located at the Bragg angle (2) corresponding to the crystalline plane of interest (X = 0 is defined as the fiber axis).…”
Section: Methodsmentioning
confidence: 99%