2019
DOI: 10.1063/1.5078951
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Electron Monte Carlo simulations of nanoporous Si thin films—The influence of pore-edge charges

Abstract: Electron transport within nanostructures can be important to varied engineering applications, such as thermoelectrics and nanoelectronics. In theoretical studies, electron Monte Carlo simulations are widely used as an alternative approach to solving the electron Boltzmann transport equation, where the energy-dependent electron scattering, exact structure shape, and detailed electric field distribution can be fully incorporated. In this work, such electron Monte Carlo simulations are employed to predict the ele… Show more

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Cited by 4 publications
(2 citation statements)
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“…Semi-classical Monte Carlo simulations are also starting to emerge in TE materials [242,243,244,245,246,247,248,249]. The advantage of MC is that the computational cost increases linearly with the system size and scattering events can be incorporated relatively easily.…”
Section: Simulation Tools For Electronic Transport In Nanostructuresmentioning
confidence: 99%
“…Semi-classical Monte Carlo simulations are also starting to emerge in TE materials [242,243,244,245,246,247,248,249]. The advantage of MC is that the computational cost increases linearly with the system size and scattering events can be incorporated relatively easily.…”
Section: Simulation Tools For Electronic Transport In Nanostructuresmentioning
confidence: 99%
“…The charge carrier depletion near pore edges may largely reduce the carrier concentration ( Tang et al., 2010 ). A potential field can build up to further scatter electrons and holes within the pore-edge depletion region ( Hao and Xiao, 2019 ; Hao et al., 2017b ), which also affects the electrical properties.…”
Section: Resultsmentioning
confidence: 99%