Electron scattering by Friedel oscillations in carbon nanotubes

Inaba, Takumi; Morimoto, Takahiro; Yamazaki, Satoshi; Okazaki, Toshiya

doi:10.1007/s12274-021-3571-0

Cited by 1 publication

(3 citation statements)

References 73 publications

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“…This scaling is due to the electron scattering at Friedel oscillations 14 . An experimental demonstration regarding to this scattering mechanisms was given in our previous study 15 . As the result of the demonstration, the scattering time due to Friedel oscillations in CNTs used in this study was estimated to be 405 fs.…”

Section: Methodsmentioning

confidence: 62%

“…Here, the ratio was calculated from areas of these Raman peaks. Therefore, MWCNTs in the CNT yarn were expected to contain a moderate amount of structural defects, which resulted in the scattering length as short as 405 nm 15 . As shown in Figure 3B, macropores were observed in the CNT yarn and MWCNTs did not fill the whole cross‐sectional area.…”

Section: Methodsmentioning

confidence: 99%

“…15 As the result of the demonstration, the scattering time due to Friedel oscillations in CNTs used in this study was estimated to be 405 fs. Assuming the Fermi velocity of approximately 1 Â 10 6 m/s, 16 the scattering length of 405 nm was estimated. Therefore, the scaling by length was legitimated as far as electrode separations were longer than 405 nm.…”

Section: Methodsmentioning

confidence: 99%

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Transport property characterization of sparse CNT networks via AFM images

Inaba

Morimoto

Okazaki

2022

Surface & Interface Analysis

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A simulation method for correlating the resistivity and resistance of sparse carbon nanotube (CNT) networks via atomic force microscopy images was proposed. For the demonstration, resistance values simulated by this method were compared with values obtained by directory measuring the resistance of sparse CNT networks.Results were also compared with those obtained by a thin-film approximation in which CNT networks are approximated as thin rectangles. Simulated resistance values were closer to the experimental values of the same samples than those estimated on the basis of the thin-film approximation. The use of atomic force microscopy (AFM) images enabled the implementation of inhomogeneity to numerical models, as well as one-to-one comparison between real samples and numerical models.

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Section: Methodsmentioning

confidence: 62%

Section: Methodsmentioning

confidence: 99%