Electron spectroscopic investigation of ethylmethylsulfide/nickel interface

Abstract

To demonstrate the interaction of ethylmethylsulfide (C 2 H 5 SCH 3 ) with an Ni(110) surface, we use xray photoelectron spectroscopy and x-ray absorption near-edge structure measurements to identify the adsorbed sulfur species and their orientation on the surface at low temperature. The S-C 2 H 5 and S-CH 3 bonds are found to be oriented at angles of 46 ± 5• and 14 ± 5• from the surface, respectively. A qualitative estimation of charge transfer from substrate to molecule is carried out by S 1s XPS measurements.