Electron spectroscopy of rare-gas clusters irradiated by x-ray free-electron laser pulses from SACLA

Abstract

We have measured electron energy spectra and asymmetry parameters of Ar clusters and Xe clusters illuminated by intense x-rays at 5 and 5.5 keV. A velocity map imaging spectrometer was developed for this purpose and employed at an x-ray free-electron laser facility, SACLA in Japan. The cluster size dependence and the peak fluence dependence of the electron spectra and asymmetry parameters are discussed.

Coherent diffractive imaging of single helium nanodroplets with a high harmonic generation source

“…Figs. 2 a, 3 and 4a ) 47 . The scattering patterns are recorded on a shot-to-shot basis using an out-of-vacuum CMOS camera.…”

Ultrafast Dynamics of a Nucleobase Analogue Illuminated by a Short Intense X-ray Free Electron Laser Pulse

“…The fragment ions resulting from the destruction of the sample, by multiphoton x-ray absorption, were detected by a multicoincidence recoil ion momentum spectrometer [36,37] [see Fig. 1 …”

“…Any change of sample due to heating was not confirmed by 1 H NMR measurements. The ions were detected by a multicoincidence recoil ion momentum spectrometer [36,37] to measure threedimensional momenta of each fragment ion. The molecular beam was crossed with the focused XFEL beam at the reaction point, and the emitted ions were projected by electrostatic fields onto an 80-mm-diameter microchannel plate (MCP) detector, in front of a delay-line anode.…”

“…The design of the ion spectrometer was similar to the one described in Ref. [37], but the electrodes were modified to enable detection of high-energy ions. The distance between the reaction point and HEX80 was 228 mm.…”

Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses

“…We measured the kinetic energy spectra of the electrons and ionic fragments by using electron velocity map imaging (VMI) [21,22] and ion time-of-flight (TOF) [23][24][25][26][27] spectrometers, respectively. The electron VMI spectrometer employed was specifically designed for use at the XFEL facility so that high-energy electrons up to 1 keV could be detected.…”