We have made direct pump-probe measurements of spin lifetimes in intrinsic and degenerate n-InAs at 300 K. In particular, we measure remarkably long spin lifetimes ( s ϳ1.6 ns) for near-degenerate epilayers of n-InAs. For intrinsic material, we determine s ϳ20 ps, in agreement with other workers. There are two main models that have been invoked for describing spin relaxation in narrow-gap semiconductors: the D'yakonov-Perel ͑DP͒ model and the Elliott-Yafet ͑EY͒ model. For intrinsic material, the DP model is believed to dominate in III-V materials above 77 K, in agreement with our results. We show that in the presence of strong n-type doping, the DP relaxation is suppressed both by the degeneracy condition and by electron-electron scattering, and that the EY model then dominates for the n-type material. We show that this same process is also responsible for a hitherto unexplained lengthening of s with n-type doping in our earlier measurements of n-InSb. Utilization of the electron spin has become a focus of interest in semiconductor electronics, or spintronics, in recent years, and it is important to realize a sufficiently long spin lifetime s to process information stored in the form of the polarization of spin ensembles.1-3 To find a way to control s , it is necessary to understand the spin relaxation mechanisms in both bulk and low-dimensional semiconductor structures which are designed so that spins can be appropriately confined and/or transferred. In contrast to GaAsbased systems, relatively little attention has been paid to InAs, even although it may be important in future spintronics applications. We previously measured spin lifetimes in narrow-gap semiconductors ͑NGSs͒, Hg 1Ϫx Cd x Te and InSb, at wavelengths between 4 and 10 m over the temperature range of 4 to 300 K. 4 We have now extended those measurements to include bulk epilayers of InAs as a function of doping at 300 K.The 4,6,7 which excites spins in the semiconductor with above-bandgap, circularly polarized light, and probes the induced bleaching with either the same or the opposite circularly polarized light ͑SCP or OCP, respectively͒. The pump and probe beams are pulsed, and by changing the time delay between the pump and probe, and comparing the SCP and OCP results, we measure the spin decay lifetime. The optical pulses for the experiment, carried out at the University of Surrey, were generated with a solidstate laser system that produces ϳ40 fs pulses from 2.5 to 11 m wavelength, with a repetition rate of 250 kHz and typical average power of 5 mW. The beams were focused onto the sample with spot sizes of approximately 100 m, and the transmitted probe light was detected with a liquid-nitrogencooled InSb photodiode.Results for the transmission change in the probe due to the pump are shown for sample IC313 in Fig. 1 for SCP and OCP configurations at a wavelength of 3.4 m; that is, just above the absorption edge. The data are in extremely good agreement with the results of other workers.6 Following Ref. 6, we plot the fractional difference in tr...