This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.This article gives an overview on the advance of spin noise spectroscopy (SNS) in semiconductors in the past 8 years from the first measurements in bulk n-GaAs [Oestreich et al., Phys. Rev. Lett. 95, 216603 (2005)] up to the recent achievement of optical detection of the intrinsic spin fluctuations of a single hole confined in an individual self-assembled quantum dot [Dahbashi et al., arXiv:1306.3183 (2013]. We discuss the general technical implementation of optical SNS and the invaluable profit of the introduction of real-time fast Fourier transform analysis into the data acquisition. By now, the full spin dynamic from the milli-to picosecond timescales can be addressed by SNS and the technique quickly strides ahead to enable real quantum non-demolition measurements in semiconductors.Spin noise spectra recorded in 2005 in bulk n-GaAs with approximately 10 9 electron spins (Oestreich et al.) and 2013 (Dahbashi et al.) for a single hole spin. The integration time for the latter is more than a factor of 40 shorter due to the significant advances in the measurement technique.