Electron stimulated polymerization of solid C60

Zhao, Y. B.; Poirier, D. M.; Pechman, R. J.; Weaver, J. H.

doi:10.1063/1.111113

Cited by 139 publications

(80 citation statements)

References 6 publications

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“…The decomposition is observed solely on the molecule selected for the indentation. Thus, we can discard that an electroninduced polymerization with neighboring molecules takes place [13].…”

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confidence: 99%

Resonant Electron Heating and Molecular Phonon Cooling in SingleC60Junctions

et al. 2008

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We study heating and heat dissipation of a single C60 molecule in the junction of a scanning tunneling microscope (STM) by measuring the electron current required to thermally decompose the fullerene cage. The power for decomposition varies with electron energy and reflects the molecular resonance structure. When the STM tip contacts the fullerene the molecule can sustain much larger currents. Transport simulations explain these effects by molecular heating due to resonant electronphonon coupling and molecular cooling by vibrational decay into the tip upon contact formation.The paradigm of molecular electronics is the use of a single molecule as an electronic device [1]. This concept is sustained on the basis that a single molecule (or a molecular thin film) should withstand the flow of electron current densities as large as 10 10 A/m 2 without degrading. A fraction of these electrons heat the molecular junction through inelastic scattering with the molecule [2]. The temperature at the junction is a consequence of an equilibrium between heating due to electron flow and heat dissipation out of the junction. The former is dominated by the coupling of electronic molecular states with molecular vibrons [2,3,4]. The latter depends on the strength of the vibrational coupling between the "hot" molecular vibrons and the bath degrees of freedom of the "cold" electrodes.Theoretical studies predicted that current-induced heating in molecular junctions can be large enough to affect the reliability of molecular devices [2]. However, experimental access to this information is very limited. Recent studies of the thermally activated force during molecular detachment from a lead [5,6] and of structural fluctuation during attachment to it [7] reveal that the temperature of a molecular junction can reach several hundred degrees under normal working conditions, thus revealing that present devices work on the limit of practical operability [8]. Heat dissipation away from the junction becomes an important issue.In this work, we characterize the mechanisms of heating and heat dissipation induced by the flow of current across a single molecule. Our approach is based on detecting the limiting electron current inducing molecular decomposition at varying applied source-drain bias (i.e. the maximum power one molecule can sustain). We use a low temperature scanning tunneling microscope (STM) to control the flow of electrons through a single C 60 molecule at an increasing rate until the molecule decomposes. By comparing the power applied for decomposition (P dec ) in tunneling regime and in contact with the STM tip we find that it depends significantly on two factors: i) P dec decreases when molecular resonances participate in the transport, evidencing that they enhance the heating; ii) P dec increases as the molecule is contacted to the source and drain electrodes, revealing the heat dissipation by phonon coupling to the leads. A good contact between the single-molecule (SM) device and the leads is hence an important requirement for its ope...

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“…The decomposition is observed solely on the molecule selected for the indentation. Thus, we can discard that an electroninduced polymerization with neighboring molecules takes place [13].…”

mentioning

confidence: 99%

Resonant Electron Heating and Molecular Phonon Cooling in SingleC60Junctions

et al. 2008

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“…Adjacent C60 molecules in such films have been observed to form cross-linked peanut-shaped structures as a result of irradiation at 3 keV [34]. Post-annealing at 200•C for 2 h reverts the peanut-shaped structures back to C60 [35].…”

Section: Discussionmentioning

confidence: 96%

Low-energy electron irradiation of preheated and gas-exposed single-wall carbon nanotubes

Ecton

Beatty

Verbeck

et al. 2016

Applied Surface Science

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Ecton, Philip A. Low-Energy Electron Irradiation of Preheated and Gas-Exposed Single-Wall Carbon Nanotubes. Doctor of Philosophy (Physics), December 2016, 110 pp., 53 figures, 40 numbered references, bibliography.We investigate the conditions under which electron irradiation of single-walled carbon nanotube (SWCNT) bundles with 2 keV electrons produces an increase in the Raman D peak.We find that an increase in the D peak does not occur when SWCNTs are preheated in situ at 600 C for 1 h in ultrahigh vacuum (UHV) before irradiation is performed. Exposing SWCNTs to air or other gases after preheating in UHV and before irradiation results in an increase in the D peak. Small diameter SWCNTs that are not preheated or preheated and exposed to air show a significant increase in the D and G bands after irradiation. X-ray photoelectron spectroscopy shows no chemical shifts in the C1s peak of SWCNTs that have been irradiated versus SWCNTs that have not been irradiated, suggesting that the increase in the D peak is not due to chemisorption of adsorbates on the nanotubes.

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“…The number of carbon atoms should be preserved during the defect formation in order to account for the fact that the defect recovers reversibly. Although such damage is not known for graphite, a similar reversible structural change is known to occur in C 60 with electron or photon irradiation [9]. The electric property changes can also be explained by the defect formation, assuming a local band gap opening induced by the defect formation [4].…”

Section: Introductionmentioning

confidence: 99%

Origin of the Electric Property Change of a Single-Wall Carbon Nanotube Caused by Low-Energy Irradiation: Defects or Substrate Charging?

Suzuki

2011

e-J. Surf. Sci. Nanotechnol.

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Low-energy irradiation-induced conductivity decrease of a single-wall carbon nanotube has been well established experimentally. However, its origin is still controversial. Irradiation effects on suspended single-wall carbon nanotubes, which are much less affected by substrate charging effects, were studied to distinguish possible origins. The results indicate that the conductivity decrease is not caused by substrate charging, but by irradiation-induced defect formation.

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Electron stimulated polymerization of solid C60

Cited by 139 publications

References 6 publications

Resonant Electron Heating and Molecular Phonon Cooling in SingleC60Junctions

Resonant Electron Heating and Molecular Phonon Cooling in SingleC60Junctions

Low-energy electron irradiation of preheated and gas-exposed single-wall carbon nanotubes

Origin of the Electric Property Change of a Single-Wall Carbon Nanotube Caused by Low-Energy Irradiation: Defects or Substrate Charging?

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