2008
DOI: 10.1111/j.1365-2818.2008.02084.x
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Electron tomography of regularly shaped nanostructures under non‐linear image acquisition

Abstract: SummaryElectron tomography allows the 3D quantitative characterization of nanostructures, provided a monotonic relationship is fulfilled between the projected signal and the atomic number and thickness of the specimen. This requirement is not satisfied if the micrographs are affected by (i) diffraction contrast, (ii) detector saturation or (iii) contrast inversion due to absorption (high-angle scattering) at high thickness. Artefacts related to the non-monotonic tomography acquisition are examined using comput… Show more

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Cited by 27 publications
(25 citation statements)
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“…no cupping artefacts [46,47]), as is clearly shown in the line profiles in Fig. 8(c) and (d) for both the V-L 2,3 maps and the HAADF maps.…”
Section: Experimental Study: Reconstructions On Experimental Maps Fromentioning
confidence: 51%
“…no cupping artefacts [46,47]), as is clearly shown in the line profiles in Fig. 8(c) and (d) for both the V-L 2,3 maps and the HAADF maps.…”
Section: Experimental Study: Reconstructions On Experimental Maps Fromentioning
confidence: 51%
“…The scattering contribution from a voxel is not just dependent on the nuclei in that voxel, but also of the form of the beam reaching the voxel. Consequently, the signal in HAADF-STEM does not vary linearly with mass-thickness, as has been observed in a number of cases [4][5][6][7][8][9] .…”
Section: Introductionmentioning
confidence: 68%
“…Our implementation is more than an order of magnitude faster than SIRT [4,5]. Previous work has applied the GT concept to TEM images, but the back-projection algorithm used in [7] needs both postreconstruction thresholding and is not proved to be convergent; the algorithm used in [8] is also not proved to be convergent. Our GT implementation [3] was applied to the same nanowire cross-sections ( Fig.…”
Section: Geometric Tomography From Shadow Outlinesmentioning
confidence: 99%