“…[48] The effect of the loading force between the tip and the self-assembled monolayer (SAM) surface in STM or C-AFM measurements is also important; [9,12,14,15] for example, loose physical contacts, induced by slight tip compression, can impede direct electron tunneling and lead to dielectric breakdown. [12,[49][50][51] Considering the above factors, the data of the contact resistance of molecular junctions obtained from different experimental approaches are rarely consistent. Therefore, the contact between organic molecules and electrodes is an important issue that needs clarification.…”