Electron-, x-ray-, and ion-stimulated decomposition of nitrate salts

Abstract

Decomposition of lithium, sodium, and ammonium nitrate stimulated by 500-eV electrons, 1254-eV X-rays, and 4-keV Ar+ ions is investigated by X-ray photoelectron spectroscopy (XPS). The core level XPS spectra show that a steady-state composition is attained at a total irradiation dose of 1017 particles/cm2 in which the damaged layer contains predominantly M2G and M202 with smaller amounts of MN03 and MN02, where = Li and Na. Irradiation of NH4N03 produces no changes detectable by XPS, suggesting that the decomposition products are all volatile. While the relative atomic concentrations of the constituent elements within the damaged layer change in a similar manner for the three modes of radiation, i.e. there is an increase in alkali metal, decrease in nitrogen, and only minor changes in oxygen concentration, the specific products and relative abundances of these products differ. Consideration of these results in terms of the mechanisms of energy deposition into the atomic lattice indicates that the energy density deposited by all three sources exceeds that required for decomposition and that the excess energy determines the extent of reaction.

Investigation of the solid-state electrolyte/cathode LiPON/LiCoO2 interface by photoelectron spectroscopy

“…The line at 407.4 eV is in good agreement with the N1s signal from LiNO 3 [26], and the other emission at 403.8 eV corresponds to the binding energy of a NO 2 − species [27,28]. Their presence was reported on bulk LiPON films by other groups [13,25].…”

“…However, in our experiments, the signal from NO 2 − species vanishes after 75 s deposition of LiPON. The LiPON bulk structure consisting of Nt and Nd seems to be delayed by the appearance of the NO 3 − [26] and NO 2 − species, which are formed first. It can be expected that this interlayer affects the conduction mechanism, which will be investigated in the future in more detail.…”

X-ray induced reduction of Au and Pt ions on silicon substrates

“…In addition to X-rays, electron, ion, and other energetic particle exposures, which are frequently encountered for cleaning and/or depthprofiling, also cause reduction of certain metal ions to their lower oxidation states [29][30][31][32][33][34]. The extent of reduction varies drastically from one metal ion to another and extensive efforts had been devoted to correlate this with certain chemical/ physical properties of them [24][25][26][27][28][29][30][31][32][33][34]. In one of our earlier work, we had claimed that the extent of X-ray induced reduction could be related with the electrochemical reduction potential of the metal ion [35,36].…”

XPS Investigation of X-Ray-Induced Reduction of Metal Ions

“…1 A particular kind of damage is the reduction of the m etal ions, which can cause severe interference in cases where determination of the formal oxidation state is important, as is the case in the majority of the applications of XANES, EXAFS, and XPS. [2][3][4][5][6][7][8][9][10] Electron, ion, and other energetic particle exposure, which is frequently utilized for cleaning and/or depth-pro ling, also causes damage, and similar to Xrays, this approach invariably gives rise to the reduction of the m etal ions to lower oxidation states and/or preferential removal of oxygen. 5,[11][12][13][14][15] The extent of reduction, however, varies drastically from one metal ion to another.…”