2004
DOI: 10.1007/s00339-004-2608-z
|View full text |Cite
|
Sign up to set email alerts
|

Electronic bond rupture of Si-Dimers on Si(001)-(2x1) induced by pulsed laser excitation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2008
2008
2010
2010

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 12 publications
0
1
0
Order By: Relevance
“…42 THL on surface sites of nonequilibrated valence holes was concluded to be the mechanism responsible for bond breaking when a Si͑111͒-͑2 ϫ 1͒ surface was excited by 1064 nm, 3.5 ns laser pulses. 39 Surface bond rupture rate was studied for Si͑111͒, 3,7,24,39 Si͑100͒, 41,43,44 and other materials. 3 The rate of bond rupture varies between 3 ϫ 10 −5 and 8 ϫ 10 −10 ML/ pulse depending on the laser wavelength and fluence.…”
Section: Nonthermal Effectsmentioning
confidence: 99%
“…42 THL on surface sites of nonequilibrated valence holes was concluded to be the mechanism responsible for bond breaking when a Si͑111͒-͑2 ϫ 1͒ surface was excited by 1064 nm, 3.5 ns laser pulses. 39 Surface bond rupture rate was studied for Si͑111͒, 3,7,24,39 Si͑100͒, 41,43,44 and other materials. 3 The rate of bond rupture varies between 3 ϫ 10 −5 and 8 ϫ 10 −10 ML/ pulse depending on the laser wavelength and fluence.…”
Section: Nonthermal Effectsmentioning
confidence: 99%