We grow 28Si/SiGe heterostructures by reduced-pressure chemical vapor deposition and terminate the stack without an epitaxial Si cap but with an amorphous Si-rich layer obtained by exposing the SiGe barrier to dichlorosilane at 500 °C. As a result, 28Si/SiGe heterostructure field-effect transistors feature a sharp semiconductor/dielectric interface and support a two-dimensional electron gas with enhanced and more uniform transport properties across a 100 mm wafer. At T = 1.7 K, we measure a high mean mobility of [Formula: see text] cm2/V s and a low mean percolation density of [Formula: see text] cm−2. From the analysis of Shubnikov–de Haas oscillations at T = 190 mK, we obtain a long mean single particle relaxation time of [Formula: see text] ps, corresponding to a mean quantum mobility and quantum level broadening of [Formula: see text] cm2/V s and [Formula: see text] [Formula: see text], respectively, and a small mean Dingle ratio of [Formula: see text], indicating reduced scattering from long range impurities and a low-disorder environment for hosting high-performance spin-qubits.