Electronic properties of the SF5Cl molecule: a comparison with SF6. I. Photoabsorption spectra near the sulphur K and chlorine K edges

Determination of sulfur environments in borosilicate waste glasses using X-ray absorption near-edge spectroscopy

“…The X-ray absorption spectrum is a plot of l versus energy in eV. The spectra were energy-calibrated to the SF 6 edge, where the edge maximum is known to be at 2486.0 eV [26]. Energy uncertainty for the sulfur edges presented here is within ±0.2 eV, where the resolution is approximately 0.4 eV.…”

Vacuum-UV and electron dissociative ionisation studies of SF5Cl

“…It has not therefore been possible to correlate appearance of certain fragment cations with dissociation of a particular electronic state of SF 5 Cl + . Inner-shell photoabsorption has been studied in the range 160-210 eV [13] and in the sulfur and chlorine K-edge region of 2400-3100 eV [14]. There have been two earlier studies of the fragment anions formed from low energy (E < 10 eV) electron attachment to SF 5 Cl [11,15], in addition to the recent study of Braun et al mentioned above [4].…”

Sulfur K-edge photofragmentation of ethylene sulfide

“…Calibration at the S 1s-edge was performed by comparison to Reynaud et al 19 using the S ͑1s͒ −1 → 6t u transition in SF 6 at 2486.0 eV. Calibration at the S 1s-edge was performed by comparison to Reynaud et al 19 using the S ͑1s͒ −1 → 6t u transition in SF 6 at 2486.0 eV.…”