Electronic speckle pattern interferometry with a holographically generated reference wave

Petrov, Valery; Lau, Bernhard

doi:10.1117/1.600788

Cited by 20 publications

(7 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…By analogy with previous methods the phase stepped speckle interferograms were automatically recorded and evaluated periodically during heating of the same PCB. 5. CONCLUSIONS Numerous modifications of electronic speckle pattern interferometers have been introduced up to now.…”

Section: Quasi-real Time Monitoring Of Dynamic Thermal Deformations Bmentioning

confidence: 99%

<title>ESPI with holographically stored waves and other innovative ESPI methods used for real-time monitoring of dynamic thermal deformations in a practical industrial environment</title>

Petrov

Lau

1999

SPIE Proceedings

Self Cite

View full text Add to dashboard Cite

Electronic speckle pattern interferometry (ESPI) is a rapidly developing optoelectronic method of nondestructive laser metrology supported with computer evaluations. It permits measurement of deformations in the micrometer and submicrometer ranges produced by an electrical signal, heating, mechanical stress or another load. Though the method seems very friendly for industrial checks it has several drawbacks which prevent its application in real industrial environment: complexity, bulkiness and high costs of optical setups, difficulties in aligning of the optical elements. There are problems in working outside the laboratory especially due to high sensitivity of ESPI devices against environmental vibrations and daylight.The method of ESPI with holographically stored waves was introduced by these authors in I 995. It permitted to avoid all drawbacks mentioned above and to build an elegant, portable ESPI device with 2 optical components only: a HOE and a plane mirror. The device works very well with different test specimens subjected to deformations and vibrations. It was found that the method and the device also suit well for quasi-real time monitoring of dynamic thermal deformations. Such a novel possibility of ESPI to monitor temporal development of deformations due to electrical heating of electronic components populating a printed circuit board (PCB) and to locate a component subjected to excessive heating is presented in this work for the first time.Temporal development of deformations of the same PCB were monitored in quasi-real time in other innovative ESPI devices also originating from our laboratory. These portable, compact devices utilize alternative physical principles for combining of object and reference ESPI waves and guiding them to the sensor of the CCD camera. Such novel devices also ensure proper acquisition and documentation of temporal development of deformations and dynamics of propagation of thermal waves. Vast experimental data properly illustrating the possibilities of the novel methods are presented.

show abstract

Section: Quasi-real Time Monitoring Of Dynamic Thermal Deformations Bmentioning

confidence: 99%

<title>ESPI with holographically stored waves and other innovative ESPI methods used for real-time monitoring of dynamic thermal deformations in a practical industrial environment</title>

Petrov

Lau

1999

SPIE Proceedings

Self Cite

View full text Add to dashboard Cite

show abstract

“…Alternatively, the photopolymer material can be used to record a hologram of the object at the test site under ambient lighting conditions rather than using momental processing of silver halide. 7 It is also advantageous to use compact laser diodes in ESPI systems for reasons of portability and for this we anticipate recording the holograms in advance at visible wavelengths and replaying them on site using diode lasers with an output power of 50 mW and with a wavelength of 785 nm. The spectral bandwidth of these holograms is sufficient to accommodate the shift in wavelength between recording and reconstruction.…”

Section: Discussionmentioning

confidence: 99%

Holographically recorded photopolymer diffractive optical element for holographic and electronic speckle-pattern interferometry

Guntaka¹,

Toal²,

Martin³

2002

Appl. Opt.

View full text Add to dashboard Cite

show abstract

“…For displacement and deformation measurements, different new techniques using conventional and holo-optical elements, image shearing camera, double dove prisms etc. The method of ESPI with holographically stored waves for real time monitoring of dynamic thermal deformations has been established by Valery Petrov (60,76) . They introduced a realtime technique for the measurement of Poisson's ratio using Digital Speckle Pattern Interferometry (45) .…”

Section: Developments In the Last Two Decadesmentioning

confidence: 99%

Electronic Speckle Pattern Interferometry techniques for non-destructive evaluation: a review

Mujeeb¹,

Nayar²,

Ravindran³

2006

Insight - Non-Destructive Testing and Condition Monitoring

View full text Add to dashboard Cite

Electronic speckle pattern interferometry with a holographically generated reference wave

Cited by 20 publications

References 0 publications

<title>ESPI with holographically stored waves and other innovative ESPI methods used for real-time monitoring of dynamic thermal deformations in a practical industrial environment</title>

<title>ESPI with holographically stored waves and other innovative ESPI methods used for real-time monitoring of dynamic thermal deformations in a practical industrial environment</title>

Holographically recorded photopolymer diffractive optical element for holographic and electronic speckle-pattern interferometry

Electronic Speckle Pattern Interferometry techniques for non-destructive evaluation: a review

Contact Info

Product

Resources

About