Submonolayer Sn deposits on Pt͑111͒ and Sn incorporated in a ()ϫ))R30°Sn/Pt͑111͒ surface alloy were oxidized by NO 2 under ultrahigh-vacuum conditions. The oxide films formed were characterized by Augerelectron spectroscopy, low-energy electron diffraction ͑LEED͒, and scanning tunneling microscopy ͑STM͒. Four different surface morphologies were identified, depending on the preparation conditions, each of them exhibiting a distinct LEED pattern. STM revealed two ordered epitaxial overlayers. One is interpreted as the adsorption of SnO pseudomolecules at preferential sites to form a (4ϫ4) coincidence lattice with the substrate. The other structure forms an incommensurate tin oxide overlayer, exhibiting a long-range Moiré pattern. The remaining LEED patterns are associated with the formation of a regular stress-relief pattern that can transform into an ordered array of tin oxide islands upon repeated oxidation. This ordered island array exhibited a (5 ϫ5) superlattice with respect to the Pt͑111͒ substrate. The variety of SnO x overlayer morphologies is attributed to subtle differences in the oxide stoichiometry and alterations in the oxide/metal interface, in particular Pt-Sn alloying.