The electronic structure of a Ga-rich wide-gap CuIn 0.1 Ga 0.9 Se 2 thin-film solar cell absorber and its interface with a solution-grown CdS buffer layer were directly investigated by using a combination of X-ray and ultraviolet photoelectron spectroscopy with inverse photoemission spectroscopy. After a state-of-the-art RbF postdeposition treatment, we observe a small amount of Rb at the absorber surface, but no indication of a Rb-(In,Ga)-Se layer. The surface band gap of the absorber is determined to 1.79 ± 0.14 eV, which is approximately 0.2 eV larger than its optical bulk band gap. The special character of the Cu-poor and Rb-containing absorber surface highlights the need for a direct and all-experimental determination of the conduction band. For the CdS/CuIn 0.1 Ga 0.9 Se 2 interface, we find a significant cliff in the conduction band (−0.53 ± 0.15 eV), which we identify as a limiting factor for the performance of such Ga-rich wide-gap devices.