2014
DOI: 10.1016/j.jallcom.2014.05.025
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Electronic structure study of Co doped CeO2 nanoparticles using X-ray absorption fine structure spectroscopy

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Cited by 34 publications
(13 citation statements)
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“…This reduction in the amplitude of the FT intensity could be ascribed to the defective crystalline lattice in the doped samples. 30,31 CN, R, and s 2 were obtained from the EXAFS analysis of Zr K and Hf L 3 -edges and tabulated in Table 2. It is clear from Table 2 that the Zr-Ce and Hf-Ce bond distances, obtained from the Zr K-edge and Hf-L 3 -edge EXAFS fitted data, are close to that estimated from the Ce K-edge EXAFS data fittings.…”
Section: Resultsmentioning
confidence: 99%
“…This reduction in the amplitude of the FT intensity could be ascribed to the defective crystalline lattice in the doped samples. 30,31 CN, R, and s 2 were obtained from the EXAFS analysis of Zr K and Hf L 3 -edges and tabulated in Table 2. It is clear from Table 2 that the Zr-Ce and Hf-Ce bond distances, obtained from the Zr K-edge and Hf-L 3 -edge EXAFS fitted data, are close to that estimated from the Ce K-edge EXAFS data fittings.…”
Section: Resultsmentioning
confidence: 99%
“…In particular, the local structure in a specific atom can be analyzed using EXAFS. Low-to-medium-energy synchrotron facilities are relatively accessible, so most of the XAFS analysis for cerianite has been conducted at the cerium L III -edge (5.7 × 10 3 eV) [29][30][31]. The EXAFS analysis at the cerium L III -edge has a somewhat lower accuracy for derived structural parameters due to its limited data range, arising from the small energy separation between the L III -and L II -edges [29][30][31].…”
Section: X-ray Absorption Fine Structure Analysis At Cerium K-edgementioning
confidence: 99%
“…Low-to-medium-energy synchrotron facilities are relatively accessible, so most XAFS analysis for cerianite has been conducted at the cerium LIII-edge (5.7 × 10 3 eV) [25][26][27]. EXAFS analysis at the cerium LIII-edge has somewhat lower accuracy for derived structural parameters due to its limited data range, arising from the small energy separation between the LIII-and LII-edges [25][26][27]. When XAFS analysis for cerianite was conducted at the cerium K-edge (4.0 × 10 4 eV), more accurate local structure around the cerium atom could be obtained because of the larger EXAFS data range, as described previously [28].…”
Section: X-ray Absorption Fine Structure Analysis At Cerium K-edgementioning
confidence: 99%