Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna

Yang, Kiyull; David, G.; Yook, Jong-Gwan; Papapolymerou, Ioannis John; Katehi, L.P.B.; Whitaker, J.F.

doi:10.1109/22.821779

Cited by 102 publications

(6 citation statements)

References 13 publications

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“…All of the above-mentioned EO probing systems are dedicated to the time domain measurement. Recently, this EO probing technique even reached out to secure the electric field distributions surrounding metal structures on various devices [4]. Inevitably, such newly-found field-mapping capability would permit many more derivative applications, such as in the characterization of MEMS antennas and antenna arrays, the verification of electromagnetic compatibility (EMC) and the failure diagnosis of microelectronic integrated circuits.…”

Section: Introductionmentioning

confidence: 99%

Non-contact bias voltage measurement using the electro-optic probing technique

Kuo¹,

Kuo²,

Wu³

et al. 2008

Meas. Sci. Technol.

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The traditional non-contact electro-optic (EO) probing technique is further extended to measure quasi-dc bias voltages. We propose a special external LiTaO3 probe equipped with a grounded side-electrode (GSE) and a power supply modulation (PSM) method. The GSE can improve the voltage measurement sensitivity and error due to the tip position variation. The PSM can make all bias voltages chopped and readily picked up by using a high sensitivity lock-in amplifier. Test results on model circuits demonstrated that the proposed new EO probing system can obtain voltage measurement results that are in good agreement with known values. With this extension function this new system can perform ac high frequency and dc bias voltage measurements as well.

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Section: Introductionmentioning

confidence: 99%

Non-contact bias voltage measurement using the electro-optic probing technique

Kuo¹,

Kuo²,

Wu³

et al. 2008

Meas. Sci. Technol.

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show abstract

“…EO probes have fairly low invasiveness, high-power robustness, and wideband nature of EO crystals. EO crystals are associated with ultrafast sampling laser pulses and can be used to realize the near-field characterization of antennae [ 31 ], and also high-power microwaves (HPM) [ 32 ]. EO probes can handle over an MV/m scale field [ 33 ] and offer a 100 dB dynamic range with excellent linearity [ 34 , 35 ].…”

Section: Simulation and Measurement Resultsmentioning

confidence: 99%

Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching

Kang

Lee

et al. 2023

Sensors

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In recent times, due to the high operating frequency and low operating voltage of modern electronic devices, intended electromagnetic interference (IEMI) has been the cause of increasing damage. In particular, targets with precision electronics such as aircrafts or missiles have shown that a high-power microwave (HPM) may cause malfunction or partial destruction of the GPS or the avionic control system. Analysis of the effects of IEMI requires electromagnetic numerical analyses. However, there are limitations to conventional numerical techniques, such as the finite element method, method of moment, or finite difference time domain method, due to the complexity and large electrical length of a real target system. In this paper, we proposed a new cylindrical mode matching (CMM) technique to analyze IEMI of the generic missile (GENEC) model, which is a hollow metal cylinder with multiple apertures. Using the CMM, we can quickly analyze the effect of the IEMI inside the GENEC model from 1.7 to 2.5 GHz. The results were compared with those of the measurements and, for verification, with the FEKO, a commercial software program developed by Altair Engineering, and showed good agreement. In this paper, the electro-optic (EO) probe was used to measure the electric field inside the GENEC model.

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“…However, these can be overcome by employing mature photonic sensing techniques. For instance, the fairly low-invasiveness, high power robustness, and/or ultrabroad bandwidth nature of EO crystals, which are associated with ultrafast sampling laser pulses, can be used to realize the near-field characterization of antennas [5], high power microwaves (HPMs) [6], and/or even terahertz pulse waveform metrology [7].…”

Section: Photonic-based Em Coupling Measurement Systemmentioning

confidence: 99%

Photonic-assisted diagnosis of electromagnetic coupling into a generic object

Lee¹,

Cho²,

Shin³

et al. 2013

Meas. Sci. Technol.

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A photonic-assisted probing system to diagnose the electromagnetic influences of an electronic subsystem against intense electronic threat is presented. The shielding effectiveness of a generic missile and the coupled fields into the missile cavity were investigated by a fiber-coupled electro-optic field probe with its associated photonic system. To characterize the absolute field strength in the cavity, the probe was calibrated with a standard gain horn antenna at the R band by generating known fields toward the generic object. The fields coupled into the metallic cavity can be resonantly built up at multiple frequencies over a power range of 32 dB. The measured resonance characteristics of the hollow generic cavity showed good agreement with the computational data. This indicates that the electromagnetic susceptibility of an electronic sub-system with an enclosed metallic cavity can be readily exploited using the photonic-assisted system presented here. The strength and spectra of the resonant fields that passed through the aperture of the generic cavity at various internal locations are presented. This measurement system is quite effective at measuring actual fields without the need for a probe compensation procedure. Thus, it can be utilized for diagnosing the shielding of a generic system against intentional electromagnetic threats when the interiors of the generic objects become highly sophisticated.

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Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna

Cited by 102 publications

References 13 publications

Non-contact bias voltage measurement using the electro-optic probing technique

Non-contact bias voltage measurement using the electro-optic probing technique

Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching

Photonic-assisted diagnosis of electromagnetic coupling into a generic object

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