Electrooptic mapping of near-field distributions in integrated microwave circuits

Yang, Kiyull; David, G.; Robertson, Susan; Whitaker, J.F.; Katehi, L.P.B.

doi:10.1109/22.739221

Cited by 60 publications

(17 citation statements)

References 11 publications

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“…4b. shows the image of the same array scanned in the system of [4]. One sees that the anticipated blurring associated with loss of the invisible spectrum is evident in Fig.…”

Section: Information Lost With the Invisible Spectrummentioning

confidence: 94%

“…The system that we report here is implemented in the spirit of [1,2] and provides a scheme that is complementary to the relatively elaborate electro-optical system of [3,4]. The near-field system is limited, of course, by the fact that invisible spectrum data is lost in a scanning plane that is removed by a few wavelengths from the radiating aperture.…”

Section: Introductionmentioning

confidence: 99%

“…[2] have proposed planar near-field scanning as a means of inferring the aperture field across a radiating array by way of standard holographic nearfield transformation. Recently, an electro-optic system capable of precise, relatively complete, sampling of near fields has been implemented [3,4]. The completeness of data in this latter system results from the fact that the sampling is done through the invasion only of a (dielectric) electro-optic probe that is scanned in immediate proximity to the radiating aperture.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Millimeter-Wave Holographic Imaging System for Radiating Array Assay and Adjustment

Pearson¹

2000

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“…4b. shows the image of the same array scanned in the system of [4]. One sees that the anticipated blurring associated with loss of the invisible spectrum is evident in Fig.…”

Section: Information Lost With the Invisible Spectrummentioning

confidence: 94%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Millimeter-Wave Holographic Imaging System for Radiating Array Assay and Adjustment

Pearson¹

2000

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“…It has been highly desired to prevent problems in the early stages of design and packaging of electronic components [1,2,3]. Applying an electromagnetic near-field probe is considered very effective to meeting this need because the information so acquired can be used to make a good electrical design [4]. Optical probing methods have attractive features such as ultra fast response [5, 6, 7, 8], non-invasiveness, and high spatial resolution [9,10].…”

Section: Introductionmentioning

confidence: 99%

“…Optical probing methods have attractive features such as ultra fast response [5, 6, 7, 8], non-invasiveness, and high spatial resolution [9,10]. By applying them to near-field measurements, performance and failure diagnosis of digital and microwave circuits [4,10,11,12] and antennas [9] were realized.…”

Section: Introductionmentioning

confidence: 99%

Ultra small electro-optic field probe fabricated by aerosol deposition

Iwanami

Nakada

Tsuda

et al. 2007

IEICE Electron. Express

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Abstract:We developed a microscopic electro-optic field probe by directly depositing a lead zirconate-titanate [PbZr 0.3 Ti 0.7 O 3 ] film onto the optical fiber edge using aerosol deposition. Its fabrication process is low-cost and relatively easy because there are no complicated procedures such as fine lithography and etching. The lateral size of the film is 125 µm, which is the same as the diameter of a typical single mode fiber, and the thickness is approximately 5 µm. An RF electro-optic signal was successfully measured over a microstrip line. The capability for detecting GHz range fields is also shown. Because it is very tiny and thin, the developed electro-optic probe has great potential for detailed electrical characterization in the microscopic regions of high performance electronic products such as the interconnecting parts between LSI packages and printed circuit boards and spaces among different LSI chips in a package. Keywords: fiber-edge electro-optic probe, aerosol deposition, lead zirconate-titanate film Classification: Photonics devices, circuits, and systems References[1] F. Caignet, S. Delmas-Bendhia, and E. Sicard, "The Challenge of Signal Integrity in Deep-Submicrometer CMOS Technology," Proc. IEEE, vol. 89, no. 4, pp. 556-573, 2001. Tech., vol. 48, no. 12, pp. 2611Tech., vol. 48, no. 12, pp. -2616Tech., vol. 48, no. 12, pp. , 2000 T. Ohara, R. Namiki, K. Igarashi, S. Wakana, and M. Tsuchiya, "Proposal of electro-optic sensor head attached to optical fiber edge," IEICE Technical Report, OPE99-22, pp. 55-60, 1999 (in Japanese

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MMIC's characterization by very near‐field technique

Nativel¹,

Marchetti²,

Falgayrettes³

et al. 2004

Micro & Optical Tech Letters

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This paper shows a method to characterize microwave circuits using a near-field scanning microscope. Applied on various samples, it shows good resolution and weak disturbance for ICs operating with very common microwave components. Here, it is applied in an industrial INTRODUCTIONToday, in order to increase the MMIC bandwidth, it is necessary to decrease the scale factor down to the micrometer range. Consequently, the characterization of these devices becomes increasingly difficult or impossible. Due to the complexity of the circuit layout, electromagnetic simulators are unusable or ineffective. Some solutions have been proposed: Black et al. [1] built up a radiofrequency bench with a S.QU.I.D. that maps the magnetic field above a sample surface up to a few GHz. Another electromagnetic near-field mapping setup based on an electro-optic probe was proposed by Yang et al. [2] for up to 20 GHz. Keilmann et al. [3] proposed a setup that works in transmission mode with coaxial probes, allowing high-subwavelength resolution to be reached. Other works have been reported in [4 -8], where resonant coaxial line or waveguide was used to determine electromagnetic properties such as dielectric function, near-field polarimetry, or resistivity. Budka et al.[9] presented a modulated perturbation technique, which is an indirect method to map the electromagnetic field: the device under test (D.U.T.) is disturbed by a low-frequency modulated signal in its near-field range. In the work of Y. Gao and I. Wolff [10,11], a collection-scanning setup is proposed to diagnose high-frequencies circuits. These methods are either expensive (electro-optic sampling method), restrictive (low-temperature operation when using the S.QU.I.D., not broadband for resonnant cavities or waveguides, and map-only passive devices), or have a more complex setup (modulated perturbation method, use of a Vector Network Analyzer).In this paper, we present a collection method and a setup to map the electromagnetic near-field of active or passive microwave circuits by miniature coaxial cable, similar to Gao et al., but with no need of a Vector Network Analyzer (VNA) This setup also allows the mapping of the electromagnetic field near a self-emitting sample. It is a relatively simple setup, since it uses only common HF components (such as amplifiers and quadratic detectors). It is also a nondestructive method, as it works without contact to measure the different electromagnetic-field components based on the antennas's shape. The D.U.T. can be as complex as possible; the setup simply collects the electromagnetic near-field above its surface. The resolution reached is about 10 micrometers and the frequency range is from 0.01 to 20 GHz (limited by the amplifiers bandwidth). This paper also presents evaluations of the probe disturbance in the near-field zone for running ICs and industrial applications with this setup. EXPERIMENTAL SETUPThe D.U.T. is placed on a micrometric displacement table driven by a computer (see Fig. 1). This configuration enables us t...

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Electrooptic mapping of near-field distributions in integrated microwave circuits

Cited by 60 publications

References 11 publications

Millimeter-Wave Holographic Imaging System for Radiating Array Assay and Adjustment

Millimeter-Wave Holographic Imaging System for Radiating Array Assay and Adjustment

Ultra small electro-optic field probe fabricated by aerosol deposition

MMIC's characterization by very near‐field technique

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