“…To further prove the production of Pt‐SACs, the crystal structures of Pt species and SiC substrate were characterized by X‐ray diffraction (XRD). As manifested in Figure 2a, SiC substrate showed good crystallinity with characteristic peaks of 35.7°, 41.4°, 60.1°, and 71.9°, which were assigned to the corresponding (111), (200), (220), and (311) crystal planes, respectively [34,35] . Interestingly, the XRD pattern of Pt 1 /SiC‐160 were similar to pure SiC substrate, indicating the absence of any crystal materials.…”