2020
DOI: 10.1103/physrevapplied.13.054026
|View full text |Cite
|
Sign up to set email alerts
|

Electrostatic Control of Phase Slips in Ti Josephson Nanotransistors

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

17
76
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
6
1

Relationship

2
5

Authors

Journals

citations
Cited by 39 publications
(93 citation statements)
references
References 47 publications
17
76
0
Order By: Relevance
“…Thus, this supports the observation that the electric field is able to disrupt the superconducting state by primarily inducing π -phase slips between the electronic states that contribute to the pairing at the Fermi level. This remark is also consistent with the enhancement of nonthermal phase fluctuations that have been observed in the switching current distributions of Ti Dayem bridges [11].…”
Section: Discussionsupporting
confidence: 89%
See 2 more Smart Citations
“…Thus, this supports the observation that the electric field is able to disrupt the superconducting state by primarily inducing π -phase slips between the electronic states that contribute to the pairing at the Fermi level. This remark is also consistent with the enhancement of nonthermal phase fluctuations that have been observed in the switching current distributions of Ti Dayem bridges [11].…”
Section: Discussionsupporting
confidence: 89%
“…As in similar experiments [1,2,6,7,[9][10][11], the critical current can be reduced, up to complete suppression at the critical gate voltage V C…”
Section: A Electric Field Vs In-and Out-of-plane Magnetic Fieldsupporting
confidence: 69%
See 1 more Smart Citation
“…For our system, is the voltage-drop across the junction and is directly proportional to the resistance and the current bias. is defined as the ratio between the width of the switching current probability distribution (SCPD) [ 23 ] and the transconductance . For the devices taken into account in this section, with a typical power consumption of ∼40 nW.…”
Section: Gate-driven Supercurrent Suppression In Nb and V Nanojuncmentioning
confidence: 99%
“…The injection of high-energy field-emitted cold-electrons into the weak-link was also hypothesized to be at the origin of the gating effect [ 21 , 22 ]. Nevertheless, even in the presence of the latter mechanism, several experimental results are not compatible with a mere power injection, resulting in overheating of the superconductor [ 2 , 3 , 23 , 24 ].…”
Section: Introductionmentioning
confidence: 99%