2012
DOI: 10.1109/tps.2011.2174447
|View full text |Cite
|
Sign up to set email alerts
|

Electrostatic Discharge Testing of Multijunction Solar Array Coupons After Combined Space Environmental Exposures

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
12
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 33 publications
(12 citation statements)
references
References 10 publications
0
12
0
Order By: Relevance
“…While Ferguson [31] showed that, for one type of solar cell array in low Earth orbit (LEO), the arcing voltage threshold was independent of whether the tests were performed on the ground or in space, no such studies have been done for GEO satellites, and other studies, such as that done by Wright et al [32], have indicated that end-of-life thresholds may be different than those measured at beginning of life, due to materials aging effects. The only way to be sure of arc thresholds for a given satellite on orbit is to have onboard voltage and arc-pulse monitors.…”
Section: Desirability Of Onboard Sensorsmentioning
confidence: 99%
“…While Ferguson [31] showed that, for one type of solar cell array in low Earth orbit (LEO), the arcing voltage threshold was independent of whether the tests were performed on the ground or in space, no such studies have been done for GEO satellites, and other studies, such as that done by Wright et al [32], have indicated that end-of-life thresholds may be different than those measured at beginning of life, due to materials aging effects. The only way to be sure of arc thresholds for a given satellite on orbit is to have onboard voltage and arc-pulse monitors.…”
Section: Desirability Of Onboard Sensorsmentioning
confidence: 99%
“…Other important strategies are to ensure that any potential problems such as floating conductors and dielectrics have either appropriate bleed paths to reduce charge build up or filters to minimize the size and passage of any resultant ESD pulses. Finally, lab testing is sometimes carried out to investigate the susceptibility of hardware to ESD, and the impact should occur [ Likar et al ., ; Wright et al ., ; Hoang et al ., ; Wong et al ., , Likar et al ., ].…”
Section: Main Findingsmentioning
confidence: 99%
“…Other important strategies are to ensure that any potential problems such as floating conductors and dielectrics have either appropriate bleed paths to reduce charge build up or filters to minimize the size and passage of any resultant ESD pulses. Finally, lab testing is sometimes carried out to investigate the susceptibility of hardware to ESD, and the impact should occur [Likar et al, 2009;Wright et al, 2012;Hoang et al, 2012;Wong et al, 2013, Likar et al, 2013. 2.2.3.…”
Section: Design Phasementioning
confidence: 99%