2007 7th IEEE Conference on Nanotechnology (IEEE NANO) 2007
DOI: 10.1109/nano.2007.4601292
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Electrostatic micromanipulation of a conductive/dielectric particle by a single probe

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Cited by 3 publications
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“…Then, the constant probe-to-plate voltage with magnitude V m is applied. When the voltage is applied, the particle repeatedly moves up and down [43,44]. The mean surface current I s is measured when the particle repeatedly moves.…”
Section: Surface Resistance R Smentioning
confidence: 99%
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“…Then, the constant probe-to-plate voltage with magnitude V m is applied. When the voltage is applied, the particle repeatedly moves up and down [43,44]. The mean surface current I s is measured when the particle repeatedly moves.…”
Section: Surface Resistance R Smentioning
confidence: 99%
“…Our group has also studied the manipulation method using a single probe [37][38][39][40][41][42][43][44][45] as shown in figure 1. The manipulation system consists of three elements: a conductive probe as a manipulator, a conductive plate as a substrate, and a dielectric particle as the target object for manipulation.…”
Section: Introductionmentioning
confidence: 99%
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