Ultraviolet
photodetectors (UVPDs) based on wide band gap semiconductors
(WBSs) are important for various civil and military applications.
However, the relatively harsh preparation conditions and the high
cost are unfavorable for commercialization. In this work, we proposed
a non-WBS UVPD by using a silicon nanowire (SiNW) array with a diameter
of 45 nm as building blocks. Device analysis revealed that the small
diameter SiNW array covered with monolayer graphene was sensitive
to UV light but insensitive to both visible and infrared light illumination,
with a typical rejection ratio of 25. Specifically, the responsivity,
specific detectivity, and external quantum efficiency under 365 nm
illumination were estimated to be 0.151 A/W, 1.37 × 1012 Jones, and 62%, respectively, which are comparable to or even better
than other WBS UVPDs. Such an abnormal photoelectrical characteristic
is related to the HE1m leaky mode resonance (LMR), which
is able to shift the peak absorption spectrum from near-infrared to
UV regions. It is also revealed that this LMR is highly dependent
on the diameter and the period of the SiNW array. These results show
narrow band gap semiconductor nanostructures as promising building
blocks for the assembly of sensitive UV photodetectors, which are
very important for various optoelectronic devices and systems.