1996
DOI: 10.1016/0168-583x(95)00912-4
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Elemental analysis by PIXE and other IBA techniques and their application to source fingerprinting of atmospheric fine particle pollution

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Cited by 88 publications
(48 citation statements)
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“…The substrates were analysed using accelerator-based Ion Beam Analysis (IBA) techniques (PIXE and PIGE) at ANSTO (Cohen, 1993;1998;Cohen et al, 1996). The IBA technique uses an 8 mm diameter beam of 2.6 MeV protons with 10-15 nA target current.…”
Section: Aerosol Samplesmentioning
confidence: 99%
“…The substrates were analysed using accelerator-based Ion Beam Analysis (IBA) techniques (PIXE and PIGE) at ANSTO (Cohen, 1993;1998;Cohen et al, 1996). The IBA technique uses an 8 mm diameter beam of 2.6 MeV protons with 10-15 nA target current.…”
Section: Aerosol Samplesmentioning
confidence: 99%
“…Furthermore, the yields of X-rays and gamma rays after just a few minutes irradiation by several nanoamps of 2 to 4 MeV protons were sufficient to provide elemental concentrations for the majority of elements of interest in air pollution studies. Therefore, PIXE in aerosol studies is receiving renewed interest globally in conjunction with other nuclear methods commonly known as ion beam analysis (IBA) technique that are well-suited to particle and aerosol filter analysis (Cohen et al, 1996;1998).…”
Section: Introductionmentioning
confidence: 99%
“…The xray spectra obtained from IBA measurements were analyzed using the computer code GUPIX (Maxwell et al, 1989;Maxwell et al, 1995). Elemental analyses from H to Pb were performed on the Teflon filters using IBA (Cohen et al, 1996). The method is described in detail elsewhere (Landsberger and Creachman, 1998).…”
Section: Multielemental Analysismentioning
confidence: 99%