2000
DOI: 10.1023/a:1004852117700
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Cited by 22 publications
(3 citation statements)
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“…[31][32][33][34][35][36][37] Furthermore, the EXAFS technique and dilatometer measurements are believed to be useful tools for examining the change of the atomistic-scale structure. 30,[38][39][40][41] Even though the experimental information from the latter gives only the correlation between intrinsic materials properties and the atomistic-scale structural change, the former shows its ability to investigate a short-range order with a very small measurement range less than nm.…”
Section: Introductionmentioning
confidence: 99%
“…[31][32][33][34][35][36][37] Furthermore, the EXAFS technique and dilatometer measurements are believed to be useful tools for examining the change of the atomistic-scale structure. 30,[38][39][40][41] Even though the experimental information from the latter gives only the correlation between intrinsic materials properties and the atomistic-scale structural change, the former shows its ability to investigate a short-range order with a very small measurement range less than nm.…”
Section: Introductionmentioning
confidence: 99%
“…Few lines of very low intensity are also observed in XRD patterns of the glass ceramic samples (X = 5, 10 and 15 mol %) which may be assigned to the Ca 3 Ti 2 O 7 phase (JCPDS -78-2480). The amount of volume fraction of crystalline phase X c was calculated by comparison of integral intensities from X-ray diffraction patterns of amorphous and completely crystalline samples as per the method reported by A. G. Ilinsky et al [17]. With increase in X mol%, in the present series the amount of PT crystalline phase is observed to increase.…”
Section: Resultsmentioning
confidence: 77%
“…HREM observation requires a difficult sample preparation and thermal analysis has an ambiguity in the enthalpy determination because of the structural relaxation during heat treatment and the interface effect of nanocrystal. And X-ray experimental methods such as extended X-ray absorption fine structure (EXAFS), anomalous X-ray scattering method, and small angle X-ray scattering have been introduced to examine the nanocrystal structure [6][7][8]. These analysis techniques have an advantage such as non-destructive test, statistical averaging, and easy sample preparation.…”
Section: Introductionmentioning
confidence: 99%