In this study, we have investigated the role of boron
nitride nanotubes
(BNNTs) on the microstructural and interconnection reliability of
a Sn–3.0 wt % Ag–0.5 wt % Cu (SAC305) lead-free solder
alloy for microelectromechanical (MEMS) packaging. The BNNT was added
in different fractions (0, 0.03, 0.1, 0.2, 0.4, and 0.6 wt %) to a
SAC305 molten bath by manual mixing and melting to fabricate a BNNT-decorated
SAC305 alloy (B-SAC). We evaluated the effects of BNNTs on the grain
morphology, intermetallic compound (IMC) thickness, wetting, and spreading
of the SAC305 matrix. The resultant B-SAC alloy was applied to join
a 1608 chip to a flip-chip MEMS package, and the joint shear strength
of the 1608 chip/Cu pad was studied. The results showed that the B-SAC
alloy with 0.4 wt % BNNTs demonstrated finer grains and IMC thickness,
a maximum spreading ratio (SR) of 94.08%, least zero-cross time of
0.5 s and surface tension of 224 mN/m, and the highest wetting force
(6.95 mN) compared to the pristine SAC305 alloy due to the adsorption
of BNNTs into the SAC305 matrix and increment in material fluidity.
The joint shear strength of the 1608/Cu pad of the MEMS package also
showed maximum improved shear strengthening and fracture energy in
B-SAC alloys.