2018
DOI: 10.1016/j.nanoen.2017.11.060
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Elevated thermoelectric figure of merit of n-type amorphous silicon by efficient electrical doping process

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Cited by 16 publications
(17 citation statements)
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“…Based on the aforementioned thermal conductivity data range, the 5 s UHA samples achieved excellent ZT values of 0.8 at room temperature, which is amongst the highest ever reported Si‐based thin film and nanowires, and the ZT comparison diagram is shown in Figure S7 in the Supporting Information. [ 55–57 ] Particularly striking, compared with reported TE materials of silicon‐based and other state of art films, the power factor of our QDs hybrid film exhibits is superior to that of conventional silicon‐based, bismuth telluride based, and other representatives high performance thermoelectric films, [ 47,55–60 ] as given in Figure 5d.…”
Section: Discussionmentioning
confidence: 65%
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“…Based on the aforementioned thermal conductivity data range, the 5 s UHA samples achieved excellent ZT values of 0.8 at room temperature, which is amongst the highest ever reported Si‐based thin film and nanowires, and the ZT comparison diagram is shown in Figure S7 in the Supporting Information. [ 55–57 ] Particularly striking, compared with reported TE materials of silicon‐based and other state of art films, the power factor of our QDs hybrid film exhibits is superior to that of conventional silicon‐based, bismuth telluride based, and other representatives high performance thermoelectric films, [ 47,55–60 ] as given in Figure 5d.…”
Section: Discussionmentioning
confidence: 65%
“…For Si‐based TE materials, ion implantation process has been proved to reduce κ by defect engineering, [ 61 ] increasing σ via heavy doping and carrier mobility enhancement effect, [ 62 ] enhancing S through the effect of amorphization. [ 55 ] Consequently, the optimal energies and doses were simulated of P‐ion by using the stopping and range ion matter (SRIM) program. The P‐ion dose implanted into the Si 1− x − y Ge x Sn y layers were 2–4 × 10 15 atoms /cm 2 and the designed doping concentrations were 2–4 × 10 20 /cm 3 with ion depth range of ≈100 nm (Figure S2a, Supporting Information), respectively.…”
Section: Methodsmentioning
confidence: 99%
“…We have obtained a PF of ∼3.4 m Wm −1 K −2 at RT using arsenicdoped n-type a-Si thin films processed at ∼500 °C. 13 For p-type Si, a PF > 1 m Wm −1 K −2 has been reported for boron-doped Si thin films which have been treated at rather a high temperature (1000 °C for hours) for the recovery of implantation damages and for dopant activation. 11 It has been well known that the crystallization of a-Si is very sensitive to annealing temperature and duration.…”
Section: Introductionmentioning
confidence: 97%
“…Recently, it becomes an attractive solution to engineer amorphous silicon (a-Si) thin films using standard silicon technology to obtain high PF silicon. 13 To construct a TEG, n-and p-type constituents of equal performance are crucial. We have obtained a PF of ∼3.4 m Wm −1 K −2 at RT using arsenicdoped n-type a-Si thin films processed at ∼500 °C.…”
Section: Introductionmentioning
confidence: 99%
“…Upon annealing, the grown-in SiH monohydride groups are partially transformed into SiH2 dihydrides and polysilane chains which have been reported to impair the performance of a-Si:H based PV/T devices [26]. Compared with c-Si cells, a-Si cells are more suitable for operating at the medium-high temperature, and are promising in solar roof [27][28][29], PV glazing [30] and photovoltaic-thermoelectric [31][32][33][34] applications. So far, there have been a few reports on the experimental study of a-Si PV systems such as a-Si PV windows which can provide daylight illuminance and electricity generation simultaneously [35][36] and a-Si PV walls [37].…”
Section: Introductionmentioning
confidence: 99%